The orientation dependence of measured inelastic scattering probabilities for fast electrons in single crystals

1979 ◽  
Vol 12 (9) ◽  
pp. 1521-1533 ◽  
Author(s):  
C J Rossouw ◽  
M J Whelan
Keyword(s):  
Inelastic Scattering ◽  
Single Crystals ◽  
Orientation Dependence ◽  
Fast Electrons

Orientation dependence of the integrated luminescence yield of CsI(T1) single crystals excited by fast electrons

1976 ◽  
Vol 19 (9) ◽  
pp. 1221-1222
Author(s):  
E. K. Zavadovskaya ◽  
S. A. Vorob'ev ◽  
S. V. Plotnikov ◽  
V. A. Prets
Keyword(s):  
Single Crystals ◽  
Orientation Dependence ◽  
Fast Electrons ◽  
Luminescence Yield

Orientation dependence of the NMR signal of deformed NaCl single crystals

1980 ◽  
Vol 15 (12) ◽  
pp. 1387-1391
Author(s):  
K. Schlothauer ◽  
G. Berg ◽  
F. Fröhlich
Keyword(s):  
Single Crystals ◽  
Orientation Dependence

Orientation dependence of yield stress in 4.4% silicon iron single crystals

1967 ◽  
Vol 15 (7) ◽  
pp. 1179-1191 ◽  
Author(s):  
S Takeuchi ◽  
E Furubayashi ◽  
T Taoka
Keyword(s):  
Single Crystals ◽  
Yield Stress ◽  
Orientation Dependence ◽  
Silicon Iron

Orientation dependence of the shape memory properties in aged Ni45.3Ti29.7Hf20Pd5 single crystals

2014 ◽  
Vol 54 ◽  
pp. 60-68 ◽  
Author(s):  
E. Acar ◽  
H.E. Karaca ◽  
H. Tobe ◽  
R.D. Noebe ◽  
Y.I. Chumlyakov
Keyword(s):  
Shape Memory ◽  
Single Crystals ◽  
Orientation Dependence ◽  
Shape Memory Properties

ICSC: a program for calculating inelastic scattering cross sections for fast electrons incident on crystals

2003 ◽  
Vol 36 (3) ◽  
pp. 940-943 ◽  
Author(s):  
M. P. Oxley ◽  
L. J. Allen
Keyword(s):  
Inelastic Scattering ◽  
Cross Sections ◽  
Dark Field ◽  
Fast Electrons ◽  
Scattering Coefficients ◽  
Einstein Model ◽  
Annular Dark Field ◽  
Inner Shell Ionization ◽  
Scattering Cross Sections ◽  
Shell Ionization

A computer program which calculates inner-shell ionization and backscattering cross sections for fast electrons incident on a crystal is presented. The program calculates the inelastic scattering coefficients for inner-shell ionization, pertinent to electron energy loss spectroscopy and energy dispersive X-ray analysis, using recently presented parameterizations of the atomic scattering factors. Orientation-dependent cross sections, suitable for atom location by channelling enhanced microanalysis, may be calculated. Inelastic scattering coefficients that allow the calculation of orientation-dependent annular dark-field and Rutherford backscattering maps are calculated using an Einstein model. In all cases, absorption due to thermal diffuse scattering, also calculated using an Einstein model, can be included.

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