Reply to “Comment on ‘Effects of hydrogen dilution on the deposition process of nano-crystalline silicon film by SiCl4/H2 plasma’”

2007 ◽  
Vol 40 (9) ◽  
pp. 2996-2997
Author(s):  
Zhaokui Wang
2006 ◽  
Vol 39 (14) ◽  
pp. 3030-3035 ◽  
Author(s):  
Zhaokui Wang ◽  
Yanhui Lou ◽  
Kuixun Lin ◽  
Xuanying Lin ◽  
Rui Huang ◽  
...  

2009 ◽  
Vol 58 (1) ◽  
pp. 565
Author(s):  
Qiu Sheng-Hua ◽  
Chen Cheng-Zhao ◽  
Liu Cui-Qing ◽  
Wu Yuan-Dan ◽  
Li Ping ◽  
...  

1998 ◽  
Vol 507 ◽  
Author(s):  
I. Ferreira ◽  
H. Águas ◽  
L. Mendes ◽  
F. Fernandes ◽  
E. Fortunato ◽  
...  

ABSTRACTThis work reports on the performances of undoped and n doped amorphous/nano-crystalline silicon films grown by hot wire plasma assisted technique. The film's structure (including the presence of several nanoparticles with sizes ranging from 5 nm to 50 nm), the composition (oxygen and hydrogen content) and the transport properties are highly dependent on the filament temperature and on the hydrogen dilution. The undoped films grown under low r.f. power (≍ 4 mWcm−2) and with filament temperatures around 1850 °K have dark conductivities below 10−1Scm−1, optical gaps of about 1.5 eV and photo-sensitivities above 105, (under AM3.5), with almost no traces of oxygen content. N- doped silicon films were also fabricated under the same conditions which attained conductivities of about 10−2Scm−1.


2015 ◽  
Vol 619 ◽  
pp. 012002
Author(s):  
C J Arendse ◽  
B A van Heerden ◽  
T F G Muller ◽  
F R Cummings ◽  
C J Oliphant ◽  
...  

1998 ◽  
Vol 47 (5) ◽  
pp. 864
Author(s):  
LIU MING ◽  
HE YU-LIANG ◽  
JIANG XING-LIU ◽  
LI GUO-HUA ◽  
HAN HE-XIANG

2007 ◽  
Vol 1030 ◽  
Author(s):  
Sara Paydavosi ◽  
Amir-Hossein Tamaddon ◽  
Shams Mohajerzadeh ◽  
Michael D Robertson

AbstractThin-film transistors (TFT) of poly and nano crystalline silicon have been made at temperature as low as 170°C on flexible PET (polyethylene terephthalate) substrates.The crystallization of the silicon film has been achieved using external mechanical stress assisted by a plasma hydrogenation technique. The formation of TFT is possible by means of a lateral crystallization of amorphous silicon under the channel region. High mobility TFTs with an electron mobility of 25cm2/Vs and an on/off ratio of 2000 have been obtained. Scanning electron microscopy, X-ray diffraction analysis and optical microscopy have been used to examine the crystallinity of the layer. In addition we report the deposition of high quality low-temperature silicon-oxide layers on PET substrates using an RF-plasma enhanced chemical vapor deposition unit with direct introduction of oxygen gas into the chamber and its reaction with Silane. Infrared spectroscopy was used to examine the quality of the oxide layer.


2000 ◽  
Vol 49 (5) ◽  
pp. 983
Author(s):  
LIU MING ◽  
WANG ZI-OU ◽  
XI ZHONG-HE ◽  
HE YU-LIANG

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