Influence of frequency and bias voltage on dielectric properties and electrical conductivity of Al/TiO2/p-Si/p+(MOS) structures
2008 ◽
Vol 41
(21)
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pp. 215103
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2019 ◽
Vol 45
(9)
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pp. 11989-12000
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Keyword(s):
2007 ◽
Vol 264
(1)
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pp. 73-78
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2021 ◽
Vol 24
(04)
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pp. 413-418
2009 ◽
Vol 6
(5)
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pp. 1010-1014
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Keyword(s):
2012 ◽
Vol 30
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pp. 012005
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2021 ◽
Vol 16
(2)
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pp. 138-147
2020 ◽