A controlled specimen preparation technique for interface studies with atom-probe field-ion microscopy

1983 ◽  
Vol 16 (7) ◽  
pp. 617-619 ◽  
Author(s):  
A Henjered ◽  
H Norden
Keyword(s):  
Atom Probe ◽  
Specimen Preparation ◽  
Preparation Technique ◽  
Probe Field ◽  
Field Ion Microscopy ◽  
Ion Microscopy

Atom Probe Field Ion Microscopy Of Multilayer Thin Films

1999 ◽  
Vol 5 (S2) ◽  
pp. 150-151
Author(s):  
D. J. Larson ◽  
A. K. Petford-Long ◽  
A. Cerezo ◽  
T. C. Anthony ◽  
M. K. Miller
Keyword(s):  
Giant Magnetoresistance ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Atom Probe ◽  
Operating Conditions ◽  
Specimen Preparation ◽  
Probe Field ◽  
Field Ion Microscopy ◽  
Ion Microscopy ◽  
Compositional Variations

Multilayer film (MLF) structures which exhibit giant-magnetoresistance (GMR) properties have applications in the areas of magnetic recording and computer memory. The magnetic properties of MLF structures are dependent upon structural and compositional variations at the atomic level. Thus, structural characterization with high spatial resolution, especially at layer interfaces, is important in order to optimize device performance with respect to processing and operating conditions. Atom probe field ion microscopy (APFIM) is one technique that has the capability to characterize the local structure and composition of MLF devices with sufficiently high resolution. However, a major difficulty has been successful specimen preparation from MLF materials, which requires fabrication of a sharply pointed needle (radius <50 nm) containing the layers of interest in the apex region. Research on specialized field ion specimen preparation techniques which use focused ion beam milling has recently enabled nanoscale MLF structures to be investigated. In the present paper, the application of atom probe microanalysis to two different MLF structures is presented.

scholarly journals Specimen Preparation and Atom Probe Field Ion Microscopy of BSCCO-2212 Superconductors

1996 ◽  
Vol 06 (C5) ◽  
pp. C5-271-C5-276
Author(s):  
D. J. Larson ◽  
P. P. Camus ◽  
J. L. Vargas ◽  
T. F. Kelly ◽  
M. K. Miller
Keyword(s):  
Atom Probe ◽  
Specimen Preparation ◽  
Probe Field ◽  
Field Ion Microscopy ◽  
Ion Microscopy

Atom-probe field ion microscopy

1992 ◽  
Vol 107 (3-6) ◽  
pp. 95-104 ◽  
Author(s):  
Manfred Leisch
Keyword(s):  
Atom Probe ◽  
Probe Field ◽  
Field Ion Microscopy ◽  
Ion Microscopy
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