Total Ionizing Dose Effects of 55-nm Silicon-Oxide-Nitride-Oxide-Silicon Charge Trapping Memory in Pulse and DC Modes
2018 ◽
Vol 35
(7)
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pp. 078502
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2017 ◽
Vol 64
(7)
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pp. 1135-1143
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2018 ◽
Vol 219
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pp. 340-346
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2019 ◽
Vol 66
(1)
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pp. 48-53
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2019 ◽
Vol 66
(1)
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pp. 420-427
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