Interface roughness scattering limited mobility in AlAs/GaAs, Al0.3Ga0.7As/GaAs and Ga0.5In0.5P/GaAs quantum wells

2003 ◽  
Vol 19 (2) ◽  
pp. 162-166 ◽  
Author(s):  
B R Nag
Open Physics ◽  
2008 ◽  
Vol 6 (3) ◽  
Author(s):  
Safi Altunöz ◽  
Hüseyin Çelik ◽  
Mehmet Cankurtaran

AbstractThe mobility of electrons in vertical transport in GaAs/Ga1−y AlyAs barrier structures was investigated using geometric magnetoresistance measurements in the dark. The samples studied had Ga1−y AlyAs (0 ≤ y ≤ 0:26) linearly graded barriers between the n+-GaAs contacts and the Ga0:74Al0:26As central barrier, which contain N w (=0, 2, 4, 7 and 10) n-doped GaAs quantum wells. The mobility was determined as functions of (i) temperature (80–290 K) at low applied voltage (0.01–0.1 V) and (ii) applied voltage (0.005–1.6 V) at selected temperatures in the range 3.5–290 K. The experimental results for the temperature dependence of low-field mobility suggest that space-charge scattering is dominant in the samples with N w=0 and 2, whereas ionized impurity scattering is dominant in the samples with N w=4, 7 and 10. The effect of polar optical phonon scattering on the mobility becomes significant in all barrier structures at temperatures above about 200 K. The difference between the measured mobility and the calculated total mobility in the samples with N w=4, 7 and 10, observed above 200 K, is attributed to the reflection of electrons from well-barrier interfaces in the quantum wells and interface roughness scattering. The rapid decrease of mobility with applied voltage at high voltages is explained by intervalley scattering of hot electrons.


2011 ◽  
Vol 21 (3) ◽  
pp. 211
Author(s):  
Tran Thi Hai ◽  
Nguyen Huyen Tung ◽  
Nguyen Trung Hong

We present a theoretical study of the effect from doping of quantum wells (QWs) on enhancement of the mobility limited by one-interface roughness scattering. Within the variational approach, we introduce the enhancement factor defined by the ratio of the overall mobility in symmetric two-side doped square QWs to that in the asymmetric one-side counterpart under the same doping and interface profiles. The enhancement is fixed by the sample parameters such as well width, sheet carrier density, and correlation length. So, we propose two-side doping as an efficient way to upgrade the quality of QWs. The two-interface roughness scattering is also incorporated to make comparison.


1992 ◽  
Vol 61 (2) ◽  
pp. 213-215 ◽  
Author(s):  
C. R. Bolognesi ◽  
H. Kroemer ◽  
J. H. English

1987 ◽  
Vol 51 (23) ◽  
pp. 1934-1936 ◽  
Author(s):  
H. Sakaki ◽  
T. Noda ◽  
K. Hirakawa ◽  
M. Tanaka ◽  
T. Matsusue

1994 ◽  
Vol 65 (12) ◽  
pp. 1578-1580 ◽  
Author(s):  
W. C. Mitchel ◽  
G. J. Brown ◽  
Ikai Lo ◽  
Said Elhamri ◽  
Mohamed Ahoujja ◽  
...  

1988 ◽  
Vol 6 (2) ◽  
pp. 183-188 ◽  
Author(s):  
R Gottinger ◽  
A Gold ◽  
G Abstreiter ◽  
G Weimann ◽  
W Schlapp

2010 ◽  
Vol 18 (3) ◽  
Author(s):  
F. Szmulowicz ◽  
H.J. Haugan ◽  
S. Elhamri ◽  
G.J. Brown ◽  
W.C. Mitchel

AbstractWe report on the results of transport studies of MBE-grown InAs/GaSb superlattices. We demonstrate that the in-plane mobility is limited by interface roughness scattering by showing that, as a function of InAs layer width L, the in-plane mobility behaves as μ ∝ L5.3, which closely follows the classic sixth power dependence expected from theory for interface-roughness-limited mobility. Fits to the mobility data indicate that, for one monolayer surface roughness, the roughness correlation length is about 35 Å. Next, we show that the in-plane carrier mobility in InAs/GaSb superlattices is inversely proportional to carrier density in n- and p-type samples, the result of screened interface roughness scattering.


1995 ◽  
Vol 18 (1) ◽  
pp. 75-81 ◽  
Author(s):  
S. Elhamri ◽  
M. Ahoujja ◽  
R. Hudgins ◽  
D.B. Mast ◽  
R.S. Newrock ◽  
...  

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