Low voltage stress-induced leakage current and traps in ultrathin oxide (1.2–2.5 nm) after constant voltage stresses
2007 ◽
Vol 22
(10)
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pp. 1165-1173
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2005 ◽
Vol 20
(8)
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pp. 668-672
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2007 ◽
Vol 47
(2-3)
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pp. 401-408
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2010 ◽
Vol 171
(1-3)
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pp. 159-161
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2008 ◽
Vol 48
(8-9)
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pp. 1171-1177
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2005 ◽
Vol 20
(11)
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pp. 1116-1121
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