Calculation of thermal noise in an atomic force microscope with a finite optical spot size

2005 ◽  
Vol 16 (6) ◽  
pp. 664-670 ◽  
Author(s):  
Tilman E Schäffer
Keyword(s):  
Atomic Force Microscope ◽  
Thermal Noise ◽  
Spot Size ◽  
Atomic Force

Failure Analysis of Laser Blown Metal Fuse Failures in Submicron Technology by C-AFM

2006 ◽  
Author(s):  
Liang-Feng Wen ◽  
Chien-Hui Chen ◽  
Allen Timothy Chang
Keyword(s):  
Failure Analysis ◽  
Atomic Force Microscope ◽  
Laser Cutting ◽  
Spot Size ◽  
Repair Rate ◽  
Atomic Force ◽  
Measurement Laser

Abstract This paper presents a method of using a conductive atomic force microscope (C-AFM) to characterize a submicron metal fuse that has been blown open inadequately by laser. In order to obtain a proper I-V curve measured using the C-AFM without affecting the incompletely opened fuse, the paper proposes a method of preserving the fuse by coating its surface with spin-on glass. The paper explains how differences in laser cutting machines resulted in the high failure repair rate of customer product despite equivalent energy and spot size settings. Analysis of the fuse bank circuitry on wafers helped to find the critical physical differences between a fully blown and a poorly blown fuse. By overcoming difficulties in preserving the blown fuse failure sites for C-AFM measurement, laser settings could be easily optimized to ensure proper fuse opening.

scholarly journals Calibration of T-shaped atomic force microscope cantilevers using the thermal noise method

2020 ◽  
Vol 91 (8) ◽  
pp. 083703
Author(s):  
Youngkyu Kim ◽  
Nicola Mandriota ◽  
Davis Goodnight ◽  
Ozgur Sahin
Keyword(s):  
Atomic Force Microscope ◽  
Thermal Noise ◽  
Atomic Force

scholarly journals Self Heating of an Atomic Force Microscope

10.14311/1141 ◽  
2010 ◽  
Vol 50 (1) ◽  
Author(s):  
O. Kučera
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Force Microscope ◽  
Thermal Noise ◽  
External Noise ◽  
Force Microscopy ◽  
Self Heating ◽  
Atomic Force ◽  
Optical Lever ◽  
Many Sources ◽  
Vibrational Noise

Atomic force microscopy (AFM) is a sensitive technique susceptible to unwanted influences, such as thermal noise, vibrational noise, etc. Although, tools that protect AFM against external noise have been developed and are widely used, there are still many sources of inherent noise. One of them is self-heating of the apparatus. This paper deals with self-heating of the AFM using an optical lever. This phenomenon is shown to be substantial in particular after activation of the microscope. The influence on the intrinsic contact noise of AFM’s is also examined. 

Characterization of photosystem II with the atomic-force microscope

1992 ◽  
Vol 50 (2) ◽  
pp. 1146-1147
Author(s):  
Kathleen M. Marr ◽  
Mary K. Lyon
Keyword(s):  
Photosystem Ii ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Biologically Active ◽  
Atomic Force ◽  
Freeze Etching ◽  
Image Averaging ◽  
Oxygen Evolving ◽  
Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

Ultra-spatially resolved synchrotron powered FT-IR microspectroscopy of individual cells of biological material

1995 ◽  
Vol 53 ◽  
pp. 884-885
Author(s):  
David L. Wetzel ◽  
John A. Reffner ◽  
Gwyn P. Williams
Keyword(s):  
Thermal Noise ◽  
Spot Size ◽  
Acquisition Time ◽  
Thermal Source ◽  
Signal To Noise ◽  
Spatially Resolved ◽  
Good Spatial Resolution ◽  
Small Spot ◽  
Ft Ir ◽  
Ir Microspectroscopy

Synchrotron radiation is 100 to 1000 times brighter than a thermal source such as a globar. It is not accompanied with thermal noise and it is highly directional and nondivergent. For these reasons, it is well suited for ultra-spatially resolved FT-IR microspectroscopy. In efforts to attain good spatial resolution in FT-IR microspectroscopy with a thermal source, a considerable fraction of the infrared beam focused onto the specimen is lost when projected remote apertures are used to achieve a small spot size. This is the case because of divergence in the beam from that source. Also the brightness is limited and it is necessary to compromise on the signal-to-noise or to expect a long acquisition time from coadding many scans. A synchrotron powered FT-IR Microspectrometer does not suffer from this effect. Since most of the unaperatured beam’s energy makes it through even a 12 × 12 μm aperture, that is a starting place for aperture dimension reduction.

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