Design and benchmarking of a low-cost shape sensing spar for in situ measurement of deflections in slender lifting surfaces in complex multiphase flows

2019 ◽  
Vol 28 (5) ◽  
pp. 055038 ◽  
Author(s):  
Isaac M Di Napoli ◽  
Y L Young ◽  
S L Ceccio ◽  
C M Harwood
Keyword(s):  
Multiphase Flows ◽  
Low Cost ◽  
In Situ Measurement ◽  
Lifting Surfaces ◽  
Shape Sensing

A simple, low-cost technique for in situ measurement of leaf P concentration in field-grown rice

2018 ◽  
Vol 182 (1) ◽  
pp. 28-30
Author(s):  
Koji Yamane ◽  
Ranee C. Mabesa-Telosa ◽  
Ryosuke Tajima ◽  
Nino P. M. C. Banayo ◽  
Yoichiro Kato
Keyword(s):  
Low Cost ◽  
In Situ Measurement ◽  
P Concentration ◽  
Leaf P

A low cost microsatellite instrument for the in situ measurement of orbital atomic oxygen effects

1997 ◽  
Vol 68 (8) ◽  
pp. 3220-3228 ◽  
Author(s):  
Ian L. Harris ◽  
Alan R. Chambers ◽  
Graham T. Roberts
Keyword(s):  
Atomic Oxygen ◽  
Low Cost ◽  
In Situ Measurement ◽  
Oxygen Effects

Low-cost Robust Polymer Optical Fiber Temperature Sensor Based on FIR Method for in Situ Measurement

2015 ◽  
Vol 44 (4) ◽  
pp. 406003
Author(s):  
杜新超 DU Xin-chao ◽  
贺正权 HE Zheng-quan ◽  
林霄 LIN Xiao ◽  
周利斌 ZHOU Li-bin ◽  
胡宝文 HU Bao-wen ◽  
...  
Keyword(s):  
Optical Fiber ◽  
Temperature Sensor ◽  
Low Cost ◽  
In Situ Measurement ◽  
Polymer Optical Fiber

scholarly journals In Situ Measurement of the Dynamic Penetration of Free-Fall Projectiles in Soft Soils Using a Low-Cost Inertial Measurement Unit

2016 ◽  
Vol 39 (2) ◽  
pp. 20140135 ◽  
Author(s):  
Anthony P. Blake ◽  
Conleth D. O'Loughlin ◽  
John P. Morton ◽  
Colm O'Beirne ◽  
Christophe Gaudin ◽  
...  
Keyword(s):  
Inertial Measurement Unit ◽  
Low Cost ◽  
Free Fall ◽  
In Situ Measurement ◽  
Measurement Unit ◽  
Soft Soils ◽  
Inertial Measurement ◽  
Dynamic Penetration

To Eliminate Curtain Effect of FIB TEM Samples by a Combination of Sample Dicing and Backside Milling

2014 ◽  
Author(s):  
Jian-Shing Luo ◽  
Hsiu Ting Lee
Keyword(s):  
Sample Preparation ◽  
Focused Ion Beam ◽  
Preparation Method ◽  
Low Cost ◽  
Ion Beam ◽  
Sample Preparation Method ◽  
Site Specific ◽  
Dual Beam ◽  
Transmission Electron

Abstract Several methods are used to invert samples 180 deg in a dual beam focused ion beam (FIB) system for backside milling by a specific in-situ lift out system or stages. However, most of those methods occupied too much time on FIB systems or requires a specific in-situ lift out system. This paper provides a novel transmission electron microscopy (TEM) sample preparation method to eliminate the curtain effect completely by a combination of backside milling and sample dicing with low cost and less FIB time. The procedures of the TEM pre-thinned sample preparation method using a combination of sample dicing and backside milling are described step by step. From the analysis results, the method has applied successfully to eliminate the curtain effect of dual beam FIB TEM samples for both random and site specific addresses.

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