In situ study of elastic strain relaxation in metamorphic InAs(Sb)/In(Ga,Al)As/GaAs heterostructures by using reflection high energy electron diffraction
2019 ◽
Vol 1400
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pp. 055035
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1997 ◽
Vol 165
(1-3)
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pp. 301-303
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1994 ◽
Vol 137
(1-2)
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pp. 187-194
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1998 ◽
Vol 16
(3)
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pp. 1507
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2011 ◽
pp. 180-211
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Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth
2011 ◽
pp. 3-28
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1996 ◽
Vol 14
(3)
◽
pp. 2357
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