scholarly journals Reflection high-energy electron diffraction during substrate rotation: A new dimension for in situ characterization

1998 ◽  
Vol 16 (3) ◽  
pp. 1507 ◽  
Author(s):  
W. Braun
Keyword(s):  
Electron Diffraction ◽  
High Energy ◽  
Energy Electron ◽  
High Energy Electron ◽  
In Situ Characterization ◽  
Substrate Rotation

scholarly journals In situ characterization of GaN quantum dot growth with reflection high-energy electron diffraction and line-of-sight mass spectrometry

2006 ◽  
Vol 99 (12) ◽  
pp. 124909 ◽  
Author(s):  
Jay S. Brown ◽  
Gregor Koblmüller ◽  
Robert Averbeck ◽  
Henning Riechert ◽  
James S. Speck
Keyword(s):  
Mass Spectrometry ◽  
Electron Diffraction ◽  
Quantum Dot ◽  
High Energy ◽  
Energy Electron ◽  
Line Of Sight ◽  
High Energy Electron ◽  
In Situ Characterization
Sign in / Sign up

Export Citation Format

Share Document