Investigation of GaN deposition on Si, Al2O3, and GaAs using in situ mass spectroscopy of recoiled ions and reflection high-energy electron diffraction
1996 ◽
Vol 14
(3)
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pp. 2357
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Keyword(s):
1994 ◽
Vol 137
(1-2)
◽
pp. 187-194
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1998 ◽
Vol 16
(3)
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pp. 1507
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Keyword(s):
2011 ◽
pp. 180-211
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Keyword(s):
Keyword(s):
Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth
2011 ◽
pp. 3-28
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Keyword(s):
Keyword(s):
Keyword(s):
2010 ◽
Vol 5
(12)
◽
pp. 1935-1941
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Keyword(s):