scholarly journals In situ measurements of X-ray peak profile asymmetry from individual grains

2010 ◽  
Vol 240 ◽  
pp. 012160 ◽  
Author(s):  
C Wejdemann ◽  
U Lienert ◽  
W Pantleon
2004 ◽  
Vol 387-389 ◽  
pp. 339-342 ◽  
Author(s):  
W. Pantleon ◽  
H.F. Poulsen ◽  
J. Almer ◽  
U. Lienert

2008 ◽  
Vol 91 (3) ◽  
pp. 760-765 ◽  
Author(s):  
Andriy Kovalskiy ◽  
Alfred C. Miller ◽  
Himanshu Jain ◽  
Maria Mitkova

2007 ◽  
Vol 62 (21) ◽  
pp. 6076-6080 ◽  
Author(s):  
Saı¨d Aferka ◽  
Michel Crine ◽  
Anil K. Saroha ◽  
Dominique Toye ◽  
Pierre Marchot

2013 ◽  
Vol 753 ◽  
pp. 279-284 ◽  
Author(s):  
Radomír Kužel ◽  
Zdeněk Matěj ◽  
Miloš Janeček

X-ray diffraction (XRD) studies of ECAP (equal-channel angular pressing) materials were performed after annealing and by in-situ measurements in XRD high-temperature chamber for samples prepared by different number of passes and number of revolutions, respectively. Main attention was given to Cu and Cu-Zr samples. Significant dependence on number of passes was found for ECAP samples. In-situ measurements were focused not only on temperature dependence but also on time evolution of the diffraction line profiles. Evaluation in terms of dislocation densities, correlation and crystallite size and its distribution was performed by our own software MSTRUCT developed for total powder diffraction pattern fitting. Abnormal growth of some grains with annealing is well-known for copper and leads to the creation of bimodal microstructure. Therefore a special care must be given to the evaluation and a model of two Cu components (larger and smaller crystallites) was fitted to the data if an indication of some crystallite growth appears either in the XRD line profile shape or in two-dimensional diffraction patterns.


2006 ◽  
Vol 42 (12) ◽  
Author(s):  
David A. DiCarlo ◽  
Yuniati Zevi ◽  
Annette Dathe ◽  
Shree Giri ◽  
Bin Gao ◽  
...  

2018 ◽  
Vol 51 (4) ◽  
pp. 1021-1034 ◽  
Author(s):  
Ryan C. Hurley ◽  
Eric B. Herbold ◽  
Darren C. Pagan

Three-dimensional X-ray diffraction (3DXRD), a method for quantifying the position, orientation and elastic strain of large ensembles of single crystals, has recently emerged as an important tool for studying the mechanical response of granular materials during compaction. Applications have demonstrated the utility of 3DXRD and X-ray computed tomography (XRCT) for assessing strains, particle stresses and orientations, inter-particle contacts and forces, particle fracture mechanics, and porosity evolution in situ. Although past studies employing 3DXRD and XRCT have elucidated the mechanics of spherical particle packings and angular particle packings with a small number of particles, there has been limited effort to date in studying angular particle packings with a large number of particles and in comparing the mechanics of these packings with those composed of a large number of spherical particles. Therefore, the focus of the present paper is on the mechanics of several hundred angular particles during compaction using in situ 3DXRD to study the crystal structure, kinematics, stresses and rotations of angular quartz grains. Comparisons are also made between the compaction response of angular grains and that of spherical grains, and stress-induced twinning within individual grains is discussed.


2008 ◽  
Vol 1079 ◽  
Author(s):  
Kai Chen ◽  
N. Tamura ◽  
K. N. Tu

ABSTRACTElectromigration is a phenomenon that has attracted much attention in the semiconductor industry because of its deleterious effects on electronic devices (such as interconnects) as they become smaller and current density passing through them increases. However, the effect of the electric current on the microstructure of interconnect lines during the very early stage of electromigration is not well documented. In the present report, we used synchrotron radiation based polychromatic X-ray microdiffraction for the in-situ study of the electromigration induced plasticity effects on individual grains of an Al (Cu) interconnect test structure. Dislocation slips which are activated by the electric current stressing are analyzed by the shape change of the diffraction peaks. The study shows polygonization of the grains due to the rearrangement of geometrically necessary dislocations (GND) in the direction of the current. Consequences of these findings are discussed.


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