scholarly journals Thickness dependence of magnetotransport properties of tungsten ditelluride

2021 ◽  
Vol 104 (16) ◽  
Author(s):  
Xurui Zhang ◽  
Vivek Kakani ◽  
John M. Woods ◽  
Judy J. Cha ◽  
Xiaoyan Shi
Keyword(s):  
1981 ◽  
Vol 42 (C6) ◽  
pp. C6-825-C6-827
Author(s):  
P. Taborek ◽  
M. Sinvani ◽  
M. Weimer ◽  
D. Goodstein

1989 ◽  
Vol 50 (C6) ◽  
pp. C6-177-C6-177
Author(s):  
J. YUAN ◽  
S. BERGER ◽  
L. M. BROWN

2002 ◽  
Vol 719 ◽  
Author(s):  
Masashi Kato ◽  
Masaya Ichimura ◽  
Eisuke Arai ◽  
Shigehiro Nishino

AbstractEpitaxial layers of 4H-SiC are grown on (0001) substrates inclined toward <1120> and <1100> directions. Defects in these films are characterized by deep level transient spectroscopy (DLTS) in order to clarify the dependence of concentrations and activation energies on substrate inclination. DLTS results show no such dependence on substrate inclination but show thickness dependence of the concentration.


1978 ◽  
Vol 13 (9) ◽  
pp. 427-431
Author(s):  
E. Bodegom ◽  
R. Coelho ◽  
T.J. Gallagher

2004 ◽  
Vol 408-410 ◽  
pp. 700-702 ◽  
Author(s):  
K.S. Ilin ◽  
S.A. Vitusevich ◽  
B.B. Jin ◽  
A.I. Gubin ◽  
N. Klein ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document