Real-time study ofa−Si:H∕c−Siheterointerface formation and epitaxial Si growth by spectroscopic ellipsometry, infrared spectroscopy, and second-harmonic generation
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2015 ◽
Vol 17
(14)
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pp. 9533-9540
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2011 ◽
Vol 58
(2)
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pp. 227-233
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2007 ◽
Vol 9
(42)
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pp. 5704
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2019 ◽
Vol 123
(18)
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pp. 11798-11806
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