Impact of the crystal structure ofHfO2on the transport properties of modelHfO2/Si/HfO2silicon-on-insulator field-effect transistors: A combined DFT-scattering theory approach
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2012 ◽
Vol 23
(5)
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pp. 554-564
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2013 ◽
Vol 15
(3)
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pp. 832-836
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2017 ◽
Vol 5
(6)
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pp. 1409-1413
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2007 ◽
Vol 111
(30)
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pp. 11480-11483
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2008 ◽
Vol 113
(4)
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pp. 1567-1574
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Transport properties of field-effect transistors with thin films of C76 and its electronic structure
2007 ◽
Vol 449
(1-3)
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pp. 160-164
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2008 ◽
Vol 254
(23)
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pp. 7600-7603
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