scholarly journals Laser-Driven Electron Lensing in Silicon Microstructures

2019 ◽  
Vol 122 (10) ◽  
Author(s):  
Dylan S. Black ◽  
Kenneth J. Leedle ◽  
Yu Miao ◽  
Uwe Niedermayer ◽  
Robert L. Byer ◽  
...  
2011 ◽  
Vol 22 (1) ◽  
pp. 015015 ◽  
Author(s):  
S Azimi ◽  
M B H Breese ◽  
Z Y Dang ◽  
Y Yan ◽  
Y S Ow ◽  
...  

2017 ◽  
Vol 177 ◽  
pp. 59-65 ◽  
Author(s):  
L. Romano ◽  
J. Vila-Comamala ◽  
K. Jefimovs ◽  
M. Stampanoni

Biomaterials ◽  
2006 ◽  
Vol 27 (24) ◽  
pp. 4374-4380 ◽  
Author(s):  
Mainak Das ◽  
Cassie A. Gregory ◽  
Peter Molnar ◽  
Lisa M. Riedel ◽  
Kerry Wilson ◽  
...  

Lab on a Chip ◽  
2013 ◽  
Vol 13 (16) ◽  
pp. 3284 ◽  
Author(s):  
Sabina Merlo ◽  
Francesca Carpignano ◽  
Gloria Silva ◽  
Francesca Aredia ◽  
A. Ivana Scovassi ◽  
...  

2013 ◽  
Vol 23 (2) ◽  
pp. 025026 ◽  
Author(s):  
Yong-Seok Lee ◽  
Yun-Ho Jang ◽  
Yong-Kweon Kim ◽  
Jung-Mu Kim

Author(s):  
Toshiyuki Tsuchiya

Abstract In this article, an overview of the mechanical reliability of silicon microstructures for micro-electro-mechanical systems (MEMS) is given to clarify what we now know and what we still have to know about silicon as a high-performance mechanical material on the microscale. Focusing on the strength and fatigue properties of silicon, attempts to understand the reliability of silicon and to predict the device reliability of silicon-based microstructures are introduced. The effective parameters on the strength and the mechanism of fatigue failure are discussed with examples of measurement data to show the design guidelines for highly reliable silicon microstructures and devices.


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