scholarly journals Effect of isopropanol on gold assisted chemical etching of silicon microstructures

2017 ◽  
Vol 177 ◽  
pp. 59-65 ◽  
Author(s):  
L. Romano ◽  
J. Vila-Comamala ◽  
K. Jefimovs ◽  
M. Stampanoni
2019 ◽  
Vol 14 (10) ◽  
pp. 1083-1086 ◽  
Author(s):  
Sanaz Zarei ◽  
Mohammad Zahedinejad ◽  
Shams Mohajerzadeh

RSC Advances ◽  
2016 ◽  
Vol 6 (19) ◽  
pp. 16025-16029 ◽  
Author(s):  
L. Romano ◽  
M. Kagias ◽  
K. Jefimovs ◽  
M. Stampanoni

Self-assembly Au nanostructures stabilize the catalyst during metal assisted chemical etching, improving the vertical profile of high aspect ratio Si dense micro-patterns on large area, such as diffraction gratings for X-ray phase contrast imaging.


Author(s):  
M.E. Lee

The crystalline perfection of bulk CdTe substrates plays an important role in their use in infrared device technology. The application of chemical etchants to determine crystal polarity or the density and distribution of crystallographic defects in (100) CdTe is not well understood. The lack of data on (100) CdTe surfaces is a result of the apparent difficulty in growing (100) CdTe single crystal substrates which is caused by a high incidence of twinning. Many etchants have been reported to predict polarity on one or both (111) CdTe planes but are considered to be unsuitable as defect etchants. An etchant reported recently has been considered to be a true defect etchant for CdTe, MCT and CdZnTe substrates. This etchant has been reported to reveal crystalline defects such as dislocations, grain boundaries and inclusions in (110) and (111) CdTe. In this study the effect of this new etchant on (100) CdTe surfaces is investigated.The single crystals used in this study were (100) CdTe as-cut slices (1mm thickness) from Bridgman-grown ingots.


2018 ◽  
Author(s):  
Julia Sun ◽  
Benjamin Almquist

For decades, fabrication of semiconductor devices has utilized well-established etching techniques to create complex nanostructures in silicon. Of these, two of the most common are reactive ion etching in the gaseous phase and metal-assisted chemical etching (MACE) in the liquid phase. Though these two methods are highly established and characterized, there is a surprising scarcity of reports exploring the ability of metallic films to catalytically enhance the etching of silicon in dry plasmas via a MACE-like mechanism. Here, we discuss a <u>m</u>etal-<u>a</u>ssisted <u>p</u>lasma <u>e</u>tch (MAPE) performed using patterned gold films to catalyze the etching of silicon in an SF<sub>6</sub>/O<sub>2</sub> mixed plasma, selectively increasing the rate of etching by over 1000%. The degree of enhancement as a function of Au catalyst configuration and relative oxygen feed concentration is characterized, along with the catalytic activities of other common MACE metals including Ag, Pt, and Cu. Finally, methods of controlling the etch process are briefly explored to demonstrate the potential for use as a liquid-free fabrication strategy.


Author(s):  
Jianwei Zhou ◽  
Wei Zheng ◽  
Taekoo Lee

Abstract Multi-Chip Package (MCP) decapsulation is now becoming a rising problem. Because for traditional decapsulation method, acid can’t dissolve the top silicon die to expose the bottom die surface in MCP. It makes inspecting the bottom die in MCP is difficult. In this paper, a new MCP decapsulation technology combining mechanical polishing with chemical etching is introduced. This new technology can remove the top die quickly without damaging the bottom die using KOH and Tetra-Methyl Ammonium Hydroxide (TMAH). The technology process and relative application are presented. The factors that affect the KOH and TMAH etch rate are studied. The usage difference between the two etchant is discussed.


Sign in / Sign up

Export Citation Format

Share Document