Two-dimensional intensity profiles of effective satellites

2002 ◽  
Vol 35 (1) ◽  
pp. 69-74 ◽  
Author(s):  
S. L. Morelhão ◽  
L. H. Avanci ◽  
A. A. Quivy ◽  
E. Abramof
Keyword(s):  
Synchrotron Radiation ◽  
Single Crystal ◽  
Structural Parameters ◽  
Azimuthal Angle ◽  
Two Dimensional ◽  
Scattering Process ◽  
X Ray ◽  
X Ray Scattering ◽  
Beam Diffraction ◽  
Ray Scattering

The observation of a new X-ray scattering process with synchrotron radiation is reported. The phenomenon is analogous to three-beam diffraction in a single crystal; however, the features in the azimuthal scans are provided by superlattice-satellite reflections instead of bulk reflections. These features were named effective satellites and they are observed over the ordinary satellite reflections as a function of the azimuthal angle. Their occurrences have been monitored in completely different superlattices by mapping the incidence and azimuthal angles of the incident X-ray beam. Effects of structural parameters of the superlattices on the effective satellites as well as the information that can be extracted by measuring their positions are discussed.

Synchrotron Radiation X-Ray Scattering Techniques for Studying the Micro- and Nanostructure of Wood and their Relation to the Mechanical Properties

2008 ◽  
Vol 599 ◽  
pp. 107-125 ◽  
Author(s):  
Martin Müller
Keyword(s):  
Cell Wall ◽  
Synchrotron Radiation ◽  
Mechanical Stress ◽  
Structural Changes ◽  
Structural Parameters ◽  
Cellulose Microfibrils ◽  
X Rays ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

X-ray scattering techniques have been a very useful tool for the non-destructive analysis of the wood structure. X-rays are sensitive to structural parameters such as the composite structure of wood cell walls, the crystal structure of cellulose microfibrils and their helical arrangement in the cell wall, which is usually described by the microfibril angle (MFA). With the availability of synchrotron radiation sources novel experiments on wood have become possible. The increased flux of X-rays makes the in situ and time-resolved investigation of structural changes upon mechanical stress possible. The low-divergence synchrotron radiation X-rays can be focused down to sub-micrometer size, enabling scanning studies of the wood nanostructure with (sub-)microscopic position resolution. This chapter highlights very recent advances in the understanding of wood micro- and nanostructure, which were only possible using synchrotron radiation. Examples include the MFA determination in the individual layers of the secondary cell wall, the imaging of the helical structure of the cellulose microfibrils in the cell wall, lattice strain as induced by applied mechanical stress and the structural changes of different wood types under external tensile stress.

Small angle X-ray scattering study of porosity variation in a styrene-divinylbenzene copolymer

1981 ◽  
Vol 46 (7) ◽  
pp. 1675-1681 ◽  
Author(s):  
Josef Baldrian ◽  
Božena N. Kolarz ◽  
Henrik Galina
Keyword(s):  
Small Angle ◽  
Structural Parameters ◽  
Two Phase ◽  
X Ray ◽  
Porosity Variation ◽  
Swelling Agent ◽  
X Ray Scattering ◽  
Styrene Divinylbenzene ◽  
Ray Scattering

Porosity variations induced by swelling agent exchange were studied in a styrene-divinylbenzene copolymer. Standard methods were used in the characterization of copolymer porosity in the dry state and the results were compared with related structural parameters derived from small angle X-ray scattering (SAXS) measurements as developed for the characterization of two-phase systems. The SAXS method was also used for porosity determination in swollen samples. The differences in the porosity of dry samples were found to be an effect of the drying process, while in the swollen state the sample swells and deswells isotropically.

scholarly journals Precise and nondestructive characterization of a ‘buried’ nanostructure in a polymer thin film using synchrotron radiation ultra-small angle X-ray scattering

2012 ◽  
Vol 45 (3) ◽  
pp. 307-312 ◽  
Author(s):  
Takamichi Shinohara ◽  
Tomoko Shirahase ◽  
Daiki Murakami ◽  
Taiki Hoshino ◽  
Moriya Kikuchi ◽  
...  
Keyword(s):  
Thin Film ◽  
Synchrotron Radiation ◽  
Small Angle ◽  
Polymer Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Nondestructive Characterization ◽  
Ray Scattering

scholarly journals Pinhole-type two-dimensional ultra-small-angle X-ray scattering on the micrometer scale

2013 ◽  
Vol 21 (1) ◽  
pp. 1-4 ◽  
Author(s):  
Hiroyuki Kishimoto ◽  
Yuya Shinohara ◽  
Yoshio Suzuki ◽  
Akihisa Takeuchi ◽  
Naoto Yagi ◽  
...  
Keyword(s):  
Small Angle ◽  
Two Dimensional ◽  
X Ray ◽  
X Ray Scattering ◽  
Detector Distance ◽  
Medium Length ◽  
Set Up ◽  
Micrometer Scale ◽  
Ray Scattering

A pinhole-type two-dimensional ultra-small-angle X-ray scattering set-up at a so-called medium-length beamline at SPring-8 is reported. A long sample-to-detector distance, 160.5 m, can be used at this beamline and a small-angle resolution of 0.25 µm−1was thereby achieved at an X-ray energy of 8 keV.

Diffuse x-ray scattering study of single crystal alpha-AgI

1983 ◽  
Vol 9-10 ◽  
pp. 1347-1351 ◽  
Author(s):  
R.J Cava ◽  
R.M Fleming ◽  
E.A Rietman
Keyword(s):  
Single Crystal ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Ray Scattering
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