A high-resolution Weissenberg camera for X-ray synchrotron radiation

1990 ◽  
Vol 23 (5) ◽  
pp. 351-354
Author(s):  
D. Hohlwein ◽  
J. D. Axe
Keyword(s):  
Phase Transformation ◽  
High Resolution ◽  
Synchrotron Radiation ◽  
Reciprocal Space ◽  
Experimental Results ◽  
Germanium Crystal ◽  
Synchrotron Source ◽  
X Ray ◽  
High Resolution Mapping ◽  
Resolution Mapping

A photographic Weissenberg camera has been constructed which can be mounted on the 2θ arm of a four-circle diffractometer. At a distance of 0.5 m from the sample the 2θ resolution for a 100 μm crystal is 0.2 mrad (0.01°), allowing a high-resolution mapping of reciprocal space at a synchrotron source in an efficient way. As sample experimental results, a study is presented of the streak system around the 111 reflection of a perfect germanium crystal and the detection of a minute phase transformation in a single-powder grain of a high-Tc superconductor.

High-Resolution Mapping of Two-Dimensional Lattice Distortions in Ion-Implanted Crystals from X-ray Diffractometry Data

1995 ◽  
Vol 28 (6) ◽  
pp. 803-811 ◽  
Author(s):  
A. Yu. Nikulin ◽  
T. E. Gureyev ◽  
A. W. Stevenson ◽  
S. W. Wilkins ◽  
H. Hashizume ◽  
...  
Keyword(s):  
High Resolution ◽  
Two Dimensional ◽  
Dimensional Lattice ◽  
X Ray ◽  
High Resolution Mapping ◽  
Resolution Mapping ◽  
Lattice Distortions ◽  
Ion Implanted

Applications of High-Resolution X-ray Mapping

1990 ◽  
Vol 48 (2) ◽  
pp. 454-455
Author(s):  
Anthony J. Garratt-Reed
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Acquisition Time ◽  
X Ray ◽  
High Resolution Mapping ◽  
X Ray Imaging ◽  
Probe Size ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
Resolution Mapping

It has been well established that x-ray imaging (mapping) of samples at high magnification in a field-emission analytical electron microscope is a viable technique when some form of correction is employed to compensate for the unavoidable image drift which occurs during the somewhat extended acquisition time of the images. The technique is only of practical use, however, if the time spent in acquiring the image results in data which would not otherwise have been obtained. It is the purpose of this paper to present examples where high-resolution mapping did provide data which was unique and essential to solve the problems under investigation.All experiments were performed in a VG Microscopes HB5 STEM, with a field-emission gun operating at 100kV. For most experiments, the probe size was of the order of 2 nm, and the probe current was 0.2-0.4 nA. The x-ray detector was a Link Analytical LZ5 windowless energydispersive x-ray spectrometer with a resolution of 137eV at 5.9kV, subtending a solid angle of 0.078Sr at the sample.

ANATOMY OF A LARGE IMPACT CRATER ON A DWARF PLANET: XM2 INITIAL HIGH-RESOLUTION MAPPING OF OCCATOR CRATER FROM DAWN

2018 ◽  
Author(s):  
Paul M. Schenk ◽  
◽  
Britney E. Schmidt ◽  
Hanna G. Sizemore ◽  
Carle M. Pieters ◽  
...  
Keyword(s):  
High Resolution ◽  
Impact Crater ◽  
Large Impact ◽  
High Resolution Mapping ◽  
Resolution Mapping
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