Quantitative Texture Analysis from X-ray Diffraction Spectra
1997 ◽
Vol 30
(4)
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pp. 443-448
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Keyword(s):
A method to obtain the orientation distribution function (ODF) of a polycrystalline material directly from X-ray diffraction spectra is presented. It uses the maximum-texture-entropy assumption to reduce the diffraction data needed for the ODF analysis. The validity of this new method is illustrated through two model examples.