Source, optical and detector requirements for X-ray diffraction and scattering

1998 ◽  
Vol 5 (3) ◽  
pp. 645-647 ◽  
Author(s):  
Colin Nave

The standard curves used to describe the properties of synchrotron radiation sources usually consist of a plot of the flux or brightness from the source as a function of wavelength. These curves are useful for the case where a high flux or brightness is required. Many experiments do not fall into this category. An alternative description of the source requirements is to provide the maximum flux into the phase space volume defined by the specimen. A diagrammatic way of illustrating how this can be achieved is derived. This illustrates how the source, optics and detectors can be matched to the requirements of a particular experiment. This approach is illustrated using, as examples, a beamline on the SRS and two beamlines planned for DIAMOND, the proposed new UK third-generation source.

1994 ◽  
Vol 198 (1-3) ◽  
pp. 228-230 ◽  
Author(s):  
A. Nikolaenko ◽  
M. Kovalchuk ◽  
Yu. Shilin ◽  
A. Ermolaev ◽  
S. Bobrovski ◽  
...  

1991 ◽  
Vol 35 (A) ◽  
pp. 329-332
Author(s):  
Michael Hart

AbstractPolycrystalline and powder diffraction is the most commonly practised method of x-ray analysis. During the last decade the construction of dedicated synchrotron radiation sources has resulted in the renaissance of these x-ray analysis methods; ab initio structure analysis and refinement, quantitative analysis of the structure, composition and stress in thin films and on surfaces, have all been improved. New techniques providing extremely high resolution, using anomalous dispersion, diffraction and scattering at grazing incidence to control x-ray penetration depth, have been developed. This brief review of work with W. Parrish at Stanford Synchrotron Radiation Laboratory and R. J. Cernik at the Daresbury Synchrotron Radiation Source is extended to indicate how third generation sources might be exploited in materials science.


1990 ◽  
Vol 34 ◽  
pp. 357-362 ◽  
Author(s):  
Mark W. Tate

The advent of intense synchrotron radiation sources for X-ray diffraction has made many otherwise difficult experiments feasible. The increased intensity will not he fully utilized, however, unless there are farther developments in detector technology. Improvement in detector characteristics will, of course, aid those using laboratory sources as well. For instance, construction of low noise, high, quantum efficiency detectors will reduce integration times and enable one to detect weak signals.


2007 ◽  
Vol 353 (18-21) ◽  
pp. 1985-1989 ◽  
Author(s):  
Y. Kajihara ◽  
M. Inui ◽  
K. Matsuda ◽  
K. Tamura ◽  
S. Hosokawa

Sign in / Sign up

Export Citation Format

Share Document