How to distinguish between opposite faces of ana-plane sapphire wafer
2018 ◽
Vol 51
(2)
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pp. 549-551
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Keyword(s):
X Ray
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A method to distinguish between two symmetrically equivalent opposite (11{\overline 2}0) and ({\overline 1}{\overline 1}20) faces of ana-plane sapphire wafer is described. It is shown that use of conventional X-ray diffraction analysis makes it possible to determine the `sign' of the sapphireaface in contrast to the `sign' of thec,morrfaces. Correct determination of thea-plane wafer orientation is important for further growth and processing of heteroepitaxial structures.
1996 ◽
Vol 98
(6)
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pp. 565-570
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1994 ◽
Vol 286
(1)
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pp. 75-80
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2010 ◽
Vol 20
(2)
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pp. 93-100
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1991 ◽
Vol 55
(3)
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pp. 745-750
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