INVESTIGATION OF SURFACE GRADIENT MICROSTRUCTURE OF SHOT PEENED S30432 STEEL BY X-RAY LINE PROFILE ANALYSIS METHOD

2016 ◽  
Vol 24 (06) ◽  
pp. 1750078 ◽  
Author(s):  
K. ZHAN ◽  
W. Q. FANG ◽  
B. ZHAO ◽  
Y. YAN ◽  
Q. FENG ◽  
...  
Keyword(s):  
Line Profile ◽  
Shot Peening ◽  
Profile Analysis ◽  
Rietveld Method ◽  
Size Variation ◽  
Domain Size ◽  
Line Profile Analysis ◽  
Analysis Method ◽  
X Ray ◽  
Gradient Microstructure

S30432 steels were processed by multistep shot peening treatment. The refined microstructures, including domain size, microstrain, domain size distribution and texture were characterized by X-ray diffraction (XRD) line profile analysis method, respectively. The results demonstrate that in the deformed layers, a gradient structure is formed after shot peening. The domain size reaches 25[Formula: see text]nm at the surface, then it decreases as the depth increases, but microstrain (0.0027) is the largest at the surface. The domain size distributions at different depths calculated by Rietveld method are consistent with domain size variation along the depth. There are no strong textures after shot peening treatment. The change of microhardness along the depth is in accordance with the gradient microstructure. It is expected that this work can offer useful information for characterizing the microstructure of shot peened materials.

Line profile analysis of synchrotron X-ray diffraction data of iron powder with bimodal microstructural profile parameters

2021 ◽  
Vol 54 (2) ◽  
Author(s):  
Ashok Bhakar ◽  
Pooja Gupta ◽  
P. N. Rao ◽  
M. K. Swami ◽  
Pragya Tiwari ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
Line Profile ◽  
Profile Analysis ◽  
Rietveld Method ◽  
Domain Size ◽  
Microstructural Characterization ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Microstructural Parameters

Room-temperature synchrotron X-ray diffraction and subsequent detailed line profile analysis of Fe powder were performed for microstructural characterization. The peak shapes of the diffraction pattern of Fe were found to be super-Lorentzian in nature and the peak widths were anisotropically broadened. These peak profile features of the diffraction pattern are related to the microstructural parameters of the material. In order to elucidate these features of the diffraction pattern, detailed line (peak) profile analyses were performed using the Rietveld method, modified Williamson–Hall plots and whole powder pattern modelling (WPPM), and related microstructural parameters were determined. Profile fitting using the Rietveld and WPPM methods with a single microstructural (unimodal) model shows systematic deviation from the experimentally observed diffraction pattern. On the basis of Rietveld analysis and microstructural modelling it is revealed that the microstructure of Fe consists of two components (bimodal profile). The microstructural parameters of crystallite/domain size distribution, dislocation density, nature of dislocations and phase fraction were evaluated for both components. The results obtained using different methods are compared, and it is shown that diffraction peak profile analysis is capable of modelling such inhomogeneous bimodal microstructures.

scholarly journals Dislocation density and Burgers vector population in fiber-textured Ni thin films determined by high-resolution X-ray line profile analysis

2012 ◽  
Vol 45 (1) ◽  
pp. 61-70 ◽  
Author(s):  
Gábor Csiszár ◽  
Karen Pantleon ◽  
Hossein Alimadadi ◽  
Gábor Ribárik ◽  
Tamás Ungár
Keyword(s):  
Thin Films ◽  
High Resolution ◽  
Dislocation Density ◽  
Line Profile ◽  
Profile Analysis ◽  
Domain Size ◽  
Line Profile Analysis ◽  
Burgers Vector ◽  
X Ray ◽  
Vector Population

Nanocrystalline Ni thin films have been produced by direct current electrodeposition with different additives and current density in order to obtain 〈100〉, 〈111〉 and 〈211〉 major fiber textures. The dislocation density, the Burgers vector population and the coherently scattering domain size distribution are determined by high-resolution X-ray diffraction line profile analysis. The substructure parameters are correlated with the strength of the films by using the combined Taylor and Hall–Petch relations. The convolutional multiple whole profile method is used to obtain the substructure parameters in the different coexisting texture components. A strong variation of the dislocation density is observed as a function of the deposition conditions.

scholarly journals Correlation between subgrains and coherently scattering domains

2005 ◽  
Vol 20 (4) ◽  
pp. 366-375 ◽  
Author(s):  
T. Ungár ◽  
G. Tichy ◽  
J. Gubicza ◽  
R. J. Hellmig
Keyword(s):  
Electron Microscopy ◽  
Line Profile ◽  
Profile Analysis ◽  
Subgrain Size ◽  
Domain Size ◽  
Line Profile Analysis ◽  
X Rays ◽  
X Ray ◽  
Transmission Electron ◽  
Dislocation Walls

Crystallite size determined by X-ray line profile analysis is often smaller than the grain or subgrain size obtained by transmission electron microscopy, especially when the material has been produced by plastic deformation. It is shown that besides differences in orientation between grains or subgrains, dipolar dislocation walls without differences in orientation also break down coherency of X-rays scattering. This means that the coherently scattering domain size provided by X-ray line profile analysis provides subgrain or cell size bounded by dislocation boundaries or dipolar walls.

Microstructure of post-deformed ECAP-Ti investigated by Multiple X-Ray Line Profile Analysis

2006 ◽  
Vol 2006 (suppl_23_2006) ◽  
pp. 129-134 ◽  
Author(s):  
E. Schafler ◽  
K. Nyilas ◽  
S. Bernstorff ◽  
L. Zeipper ◽  
M. Zehetbauer ◽  
...  
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
X Ray

scholarly journals X-ray line profile analysis in alakali-treated ramie fiber

2003 ◽  
Vol 60 (6) ◽  
pp. 919-922 ◽  
Author(s):  
K. P. Sao ◽  
B. K. Samantaray ◽  
S. Bhattacherjee
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Ramie Fiber ◽  
Line Profile Analysis ◽  
X Ray

scholarly journals Investigations on Microstructural and Layer Disorder Parameters of Na-Montmorillonite-Glycine Intercalation Compounds

2012 ◽  
Vol 60 (1) ◽  
pp. 25-29 ◽  
Author(s):  
Adnan Hossain Khan ◽  
Parimal Bala ◽  
AFM Mustafizur Rahman ◽  
Mohammad Nurnabi
Keyword(s):  
Crystallite Size ◽  
Chain Length ◽  
Line Profile ◽  
Profile Analysis ◽  
Interlayer Spacing ◽  
Line Profile Analysis ◽  
X Ray ◽  
Microstructural Parameters ◽  
Silicate Layers ◽  
Layer Disorder

Glycine-Montmorillonite (Gly-MMT) composite has been synthesized through intercalation process using Na-Montmorillonite (Na- MMT) and glycine ethylester hydrochloride. Gly-MMT was employed for the synthesis of dipeptide (Gly-Gly-MMT). Microstructural parameters such as crystallite size, r.m.s. strain (<e2>1/2) and layer disorder parameters such as variation of interlayer spacing (g) and proportion of planes affected by such defects (?) of the samples have been calculated by X-ray line profile analysis. In comparison to Na-MMT the basal spacings (d001) of Gly-MMT and Gly-Gly-MMT were reduced by 2.4Å and 1.8Å respectively. The value of d001 of Gly-Gly-MMT (13.3 Å) suggests the monolayer orientation of dipeptide into interlayer spaces. It is also suggested that more homogeneity in the stacking of silicate layers is attained in Gly-Gly-MMT due to the increased chain length of the dipeptide and orientation in monolayer style.DOI: http://dx.doi.org/10.3329/dujs.v60i1.10331Dhaka Univ. J. Sci. 60(1): 25-29, 2012 (January)

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