Tests and characterization of a laterally graded multilayer Montel mirror

2013 ◽  
Vol 21 (1) ◽  
pp. 16-23 ◽  
Author(s):  
K. Mundboth ◽  
J. Sutter ◽  
D. Laundy ◽  
S. Collins ◽  
S. Stoupin ◽  
...  
Keyword(s):  
Experimental Data ◽  
High Resolution ◽  
Ray Tracing ◽  
Multilayer Mirrors ◽  
Ray Optics ◽  
X Ray ◽  
X Ray Scattering ◽  
Photon Source ◽  
Ray Scattering

Multilayers are becoming an increasingly important tool in X-ray optics. The essential parameters to design a pair of laterally graded multilayer mirrors arranged in a Montel-type configuration for use as an X-ray collimating device are provided. The results of X-ray reflectometry tests carried out on the optics in addition to metrology characterization are also shown. Finally, using experimental data and combined with X-ray tracing simulations it is demonstrated that the mirror meets all stringent specifications as required for a novel ultra-high-resolution inelastic X-ray scattering spectrometer at the Advanced Photon Source.

Design and characterization of an undulator beamline optimized for small-angle coherent X-ray scattering at the Advanced Photon Source

1999 ◽  
Vol 6 (6) ◽  
pp. 1174-1184 ◽  
Author(s):  
A. R. Sandy ◽  
L. B. Lurio ◽  
S. G. J. Mochrie ◽  
A. Malik ◽  
G. B. Stephenson ◽  
...  
Keyword(s):  
Small Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Photon Source ◽  
Ray Scattering

scholarly journals Characterization of stacking faults in thick 3C-SiC crystals using high-resolution diffuse X-ray scattering

2008 ◽  
Vol 310 (5) ◽  
pp. 982-987 ◽  
Author(s):  
A. Boulle ◽  
D. Chaussende ◽  
F. Conchon ◽  
G. Ferro ◽  
O. Masson
Keyword(s):  
High Resolution ◽  
Stacking Faults ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

The dedicated high-resolution grazing-incidence X-ray scattering beamline 8-ID-E at the Advanced Photon Source

2012 ◽  
Vol 19 (4) ◽  
pp. 627-636 ◽  
Author(s):  
Zhang Jiang ◽  
Xuefa Li ◽  
Joseph Strzalka ◽  
Michael Sprung ◽  
Tao Sun ◽  
...  
Keyword(s):  
High Resolution ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Photon Source ◽  
Ray Scattering

Quantitative characterization of the contrast mechanisms of ultra-small-angle X-ray scattering imaging

2008 ◽  
Vol 41 (2) ◽  
pp. 416-427 ◽  
Author(s):  
F. Zhang ◽  
G. G. Long ◽  
L. E. Levine ◽  
J. Ilavsky ◽  
P. R. Jemian
Keyword(s):  
Ray Tracing ◽  
Small Angle ◽  
Diffraction Theory ◽  
X Ray ◽  
X Ray Scattering ◽  
X Ray Imaging ◽  
Contrast Mechanism ◽  
Good Agreement ◽  
Ray Scattering

A general treatment of X-ray imaging contrast for ultra-small-angle X-ray scattering (USAXS) imaging is presented; this approach makes use of phase propagation and dynamical diffraction theory to account quantitatively for the intensity distribution at the detector plane. Simulated results from a model system of micrometre-sized spherical SiO2particles embedded in a polypropylene matrix show good agreement with experimental measurements. Simulations by means of a separate geometrical ray-tracing method also account for the features in the USAXS images and offer a complementary view of small-angle X-ray scattering as a contrast mechanism. The ray-tracing analysis indicates that refraction, in the form of Porod scattering, and, to a much lesser extent, X-ray reflection account for the USAXS imaging contrast.

Dispersive spread of virtual sources by asymmetric X-ray monochromators

2012 ◽  
Vol 45 (2) ◽  
pp. 255-262 ◽  
Author(s):  
X. R. Huang ◽  
A. T. Macrander ◽  
M. G. Honnicke ◽  
Y. Q. Cai ◽  
Patricia Fernandez
Keyword(s):  
High Resolution ◽  
High Precision ◽  
Virtual Source ◽  
Angular Dispersion ◽  
Ray Optics ◽  
X Ray ◽  
Back Reflection ◽  
X Ray Scattering ◽  
Ray Scattering

The principles of the virtual source spread (spatial broadening) phenomenon induced by angular dispersion in asymmetric X-ray Bragg reflections are illustrated, from which the virtual source properties are analyzed for typical high-resolution multiple-crystal monochromators, including inline four-bounce dispersive monochromators, back-reflection-dispersion monochromators and nondispersive nested channel-cut monochromators. It is found that dispersive monochromators can produce spread virtual sources of a few millimetres in size, which may prevent efficient microfocusing of the beam as required by inelastic X-ray scattering spectroscopy and other applications. Possible schemes to mitigate this problem are discussed. The analyses may provide important guidelines for designing and optimizing modern high-precision synchrotron X-ray optics and beamline instrumentation for spectroscopy, imaging and nanofocusing applications.

Characterization of interface roughness in W/Si multilayers by high resolution diffuse X-ray scattering

1996 ◽  
Vol 221 (1-4) ◽  
pp. 13-17 ◽  
Author(s):  
T. Salditt ◽  
D. Lott ◽  
T.H. Metzger ◽  
J. Peisl ◽  
G. Vignaud ◽  
...  
Keyword(s):  
High Resolution ◽  
Interface Roughness ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Characterization of Mo/Si soft X-ray multilayer mirrors by grazing-incidence small-angle X-ray scattering

Vacuum ◽  
2009 ◽  
Vol 84 (1) ◽  
pp. 19-25 ◽  
Author(s):  
P. Siffalovic ◽  
E. Majkova ◽  
L. Chitu ◽  
M. Jergel ◽  
S. Luby ◽  
...  
Keyword(s):  
Small Angle ◽  
Grazing Incidence ◽  
Multilayer Mirrors ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

High resolution inelastic x-ray scattering spectrometer at the advanced photon source

1998 ◽  
Vol 69 (9) ◽  
pp. 3109-3112 ◽  
Author(s):  
M. Schwoerer-Böhning ◽  
A. T. Macrander ◽  
P. M. Abbamonte ◽  
D. A. Arms
Keyword(s):  
High Resolution ◽  
X Ray ◽  
X Ray Scattering ◽  
Photon Source ◽  
Ray Scattering

Small angle X-ray scattering study of porosity variation in a styrene-divinylbenzene copolymer

1981 ◽  
Vol 46 (7) ◽  
pp. 1675-1681 ◽  
Author(s):  
Josef Baldrian ◽  
Božena N. Kolarz ◽  
Henrik Galina
Keyword(s):  
Small Angle ◽  
Structural Parameters ◽  
Two Phase ◽  
X Ray ◽  
Porosity Variation ◽  
Swelling Agent ◽  
X Ray Scattering ◽  
Styrene Divinylbenzene ◽  
Ray Scattering

Porosity variations induced by swelling agent exchange were studied in a styrene-divinylbenzene copolymer. Standard methods were used in the characterization of copolymer porosity in the dry state and the results were compared with related structural parameters derived from small angle X-ray scattering (SAXS) measurements as developed for the characterization of two-phase systems. The SAXS method was also used for porosity determination in swollen samples. The differences in the porosity of dry samples were found to be an effect of the drying process, while in the swollen state the sample swells and deswells isotropically.

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