scholarly journals Revisit to diffraction anomalous fine structure

2014 ◽  
Vol 21 (6) ◽  
pp. 1247-1251 ◽  
Author(s):  
T. Kawaguchi ◽  
K. Fukuda ◽  
K. Tokuda ◽  
K. Shimada ◽  
T. Ichitsubo ◽  
...  
Keyword(s):  
Fine Structure ◽  
Local Structure ◽  
Spectroscopic Analysis ◽  
Direct Determination ◽  
Polycrystalline Sample ◽  
X Ray Diffraction ◽  
X Ray ◽  
Area Detector ◽  
State And Local

The diffraction anomalous fine structure (DAFS) method that is a spectroscopic analysis combined with resonant X-ray diffraction enables the determination of the valence state and local structure of a selected element at a specific crystalline site and/or phase. This method has been improved by using a polycrystalline sample, channel-cut monochromator optics with an undulator synchrotron radiation source, an area detector and direct determination of resonant terms with a logarithmic dispersion relation. This study makes the DAFS method more convenient and saves a large amount of measurement time in comparison with the conventional DAFS method with a single crystal. The improved DAFS method has been applied to some model samples, Ni foil and Fe3O4powder, to demonstrate the validity of the measurement and the analysis of the present DAFS method.

Direct Determination of the Local Structure in Molten Alumina by High Temperature X-Ray Diffraction

1995 ◽  
Vol 50 (8) ◽  
pp. 770-774 ◽  
Author(s):  
Y. Waseda ◽  
K. Sugiyama ◽  
J. M. Toguri
Keyword(s):  
High Temperature ◽  
Diffraction Study ◽  
Local Structure ◽  
Direct Determination ◽  
X Ray Diffraction ◽  
Interference Function ◽  
X Ray ◽  
Local Ordering

Abstract A high temperature X-ray diffraction study of molten alumina has been carried out at 2363 K (2090°C). The local ordering parameters in molten alumina were estimated by using the interference function refining technique. Octahedrally coordinated aluminum is suggested to remain in the melt as the fundamental local structure.

Direct Determination of Stress Levels in Sputtered Films by means of X-Ray Diffraction Topographic Method

1987 ◽  
Vol 26 (Part 1, No. 1) ◽  
pp. 157-161 ◽  
Author(s):  
Osamu Nittono ◽  
Yoshihiro Sadamoto ◽  
Sheng Kai Gong
Keyword(s):  
Direct Determination ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputtered Films ◽  
Stress Levels

Direct determination of strain and composition in InGaAs nano-islands using anomalous grazing incidence x-ray diffraction

2004 ◽  
Vol 36 (1-3) ◽  
pp. 11-19 ◽  
Author(s):  
M. Sztucki ◽  
T.U. Schülli ◽  
T.H. Metzger ◽  
E. Beham ◽  
D. Schuh ◽  
...  
Keyword(s):  
Direct Determination ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray

D-5 The Direct Determination of X-ray Diffraction Data from Specific Depths

2004 ◽  
Vol 19 (2) ◽  
pp. 195-195
Author(s):  
A. Broadhurst ◽  
K. D. Rogers ◽  
D. W. Lane ◽  
T. W. Lowe
Keyword(s):  
Diffraction Data ◽  
Direct Determination ◽  
X Ray Diffraction ◽  
X Ray

The direct determination of X-ray diffraction data from specific depths

2005 ◽  
Vol 20 (3) ◽  
pp. 233-240
Author(s):  
A. Broadhurst ◽  
K. D. Rogers ◽  
D. W. Lane ◽  
T. W. Lowe
Keyword(s):  
Diffraction Data ◽  
Direct Method ◽  
Direct Determination ◽  
Simulated Data ◽  
X Ray Diffraction ◽  
Linear Absorption ◽  
X Ray ◽  
Measured Angle ◽  
Data Collections

A direct method for determining powder diffraction data from a range of depths is described, where the linear absorption coefficient may vary with depth. A series of traditional data collections with varying angles of incidence are required, and the X-ray diffraction data arising from specific depths will be calculated by the transformation of these measured, angle-dependent spectra. These may then be analysed using any conventional method in order to gain information about characteristics of the sample in question at specific depths. Regularisation techniques have been used to solve the governing Fredholm integral equation to determine the depth-dependent diffractograms. The method has been validated by the use of simulated data having known model profiles, and has also been applied to experimental data from polycrystalline thin film samples.

Determination of Shearing Stresses (τxz and τyz) Using X-Ray Diffraction Method with Two-Dimensional Detector

2012 ◽  
Vol 706-709 ◽  
pp. 1719-1724
Author(s):  
Toshihiko Sasaki ◽  
Junichi Akita ◽  
Yasutomo Sone ◽  
Yuichi Kobayashi
Keyword(s):  
Present Method ◽  
Lattice Spacing ◽  
Diffraction Method ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
X Ray ◽  
Area Detector ◽  
Debye Ring ◽  
Detector Type

Measurement of shearing stresses, τxzand τyz, by X-ray diffraction technique with two-dimensional detector was studied. The principle which was developed for an area detector type X-ray triaxial stress analysis was adopted for this purpose. In the present method, Debye ring was measured first and its whole part was used for determining shearing stresses. One Debye ring is enough to determine shearing stresses without accurate diffraction data such as lattice spacing in stress free. The result of the simulation showed that the present method is useful for the evaluation of shearing stresses by X-ray diffraction technique.

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