Protein crystallography beamline (PX-BL21) at Indus-2 synchrotron

The protein crystallography beamline (PX-BL21), installed at the 1.5 T bending-magnet port at the Indian synchrotron (Indus-2), is now available to users. The beamline can be used for X-ray diffraction measurements on a single crystal of macromolecules such as proteins, nucleic acids and their complexes. PX-BL21 has a working energy range of 5–20 keV for accessing the absorption edges of heavy elements commonly used for phasing. A double-crystal monochromator [Si(111) and Si(220)] and a pair of rhodium-coated X-ray mirrors are used for beam monochromatization and manipulation, respectively. This beamline is equipped with a single-axis goniometer, Rayonix MX225 CCD detector, fluorescence detector, cryogenic sample cooler and automated sample changer. Additional user facilities include a workstation for on-site data processing and a biochemistry laboratory for sample preparation. In this article the beamline, other facilities and some recent scientific results are briefly described.

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HAXPES beamline PES-BL14 at the Indus-2 synchrotron radiation source

Journal of Synchrotron Radiation ◽

10.1107/s1600577518008408 ◽

2018 ◽

Vol 25 (5) ◽

pp. 1541-1547 ◽

Cited By ~ 15

Author(s):

Jagannath ◽

U. K. Goutam ◽

R. K. Sharma ◽

J. Singh ◽

K. Dutta ◽

...

Keyword(s):

Thin Film ◽

High Resolution ◽

Electron Spectroscopy ◽

High Energy ◽

Solid Samples ◽

Double Crystal ◽

X Ray ◽

Double Crystal Monochromator ◽

Ccd Detector ◽

Scientific Results

The Hard X-ray Photo-Electron Spectroscopy (HAXPES) beamline (PES-BL14), installed at the 1.5 T bending-magnet port at the Indian synchrotron (Indus-2), is now available to users. The beamline can be used for X-ray photo-emission electron spectroscopy measurements on solid samples. The PES beamline has an excitation energy range from 3 keV to 15 keV for increased bulk sensitivity. An in-house-developed double-crystal monochromator [Si (111)] and a platinum-coated X-ray mirror are used for the beam monochromatization and manipulation, respectively. This beamline is equipped with a high-energy (up to 15 keV) high-resolution (meV) hemispherical analyzer with a microchannel plate and CCD detector system with SpecsLab Prodigy and CasaXPS software. Additional user facilities include a thin-film laboratory for sample preparation and a workstation for on-site data processing. In this article, the design details of the beamline, other facilities and some recent scientific results are described.

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Protein crystallography beamline BL2S1 at the Aichi synchrotron

Journal of Synchrotron Radiation ◽

10.1107/s1600577516018579 ◽

2017 ◽

Vol 24 (1) ◽

pp. 338-343 ◽

Cited By ~ 21

Author(s):

Nobuhisa Watanabe ◽

Takayuki Nagae ◽

Yusuke Yamada ◽

Ayana Tomita ◽

Naohiro Matsugaki ◽

...

Keyword(s):

High Pressure ◽

Diamond Anvil Cell ◽

Protein Crystallography ◽

X Ray Diffraction ◽

Open Flow ◽

X Ray ◽

Industrial Organizations ◽

Ccd Detector ◽

Diamond Anvil ◽

Cutoff Filter

The protein crystallography beamline BL2S1, constructed at one of the 5 T superconducting bending-magnet ports of the Aichi synchrotron, is available to users associated with academic and industrial organizations. The beamline is mainly intended for use in X-ray diffraction measurements of single-crystals of macromolecules such as proteins and nucleic acids. Diffraction measurements for crystals of other materials are also possible, such as inorganic and organic compounds. BL2S1 covers the energy range 7–17 keV (1.8–0.7 Å) with an asymmetric-cut curved single-crystal monochromator [Ge(111) or Ge(220)], and a platinum-coated Si mirror is used for vertical focusing and as a higher-order cutoff filter. The beamline is equipped with a single-axis goniometer, a CCD detector, and an open-flow cryogenic sample cooler. High-pressure protein crystallography with a diamond anvil cell can also be performed using this beamline.

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ID14 `Quadriga', a Beamline for Protein Crystallography at the ESRF

Journal of Synchrotron Radiation ◽

10.1107/s0909049597018785 ◽

1998 ◽

Vol 5 (3) ◽

pp. 215-221 ◽

Cited By ~ 22

Author(s):

S. Wakatsuki ◽

H. Belrhali ◽

E. P. Mitchell ◽

W. P. Burmeister ◽

S. M. McSweeney ◽

...

Keyword(s):

User Interface ◽

Data Collection ◽

Graphical User Interface ◽

Macromolecular Crystallography ◽

Double Crystal ◽

X Ray ◽

Double Crystal Monochromator ◽

Diamond Crystals ◽

Ccd Detector ◽

First Results

The ESRF undulator beamline ID14 `Quadriga' is dedicated to monochromatic macromolecular crystallography. Using two undulators with 23 mm and 42 mm periods and a minimum gap of 16 mm installed on a high-β section, it will provide high-brilliance X-ray beams at around 13.5 keV, as well as a wide tuneability between 6.8 and 40 keV. Based on the Troika concept, this beamline has four simultaneously operating experimental stations: three side stations, EH1, EH2 and EH3, using thin diamond crystals, and an end station, EH4, with a fast-scan double-crystal monochromator. Station EH3 has a κ-diffractometer, and an off-line Weissenberg camera with a large 80 × 80 cm active area combined with a 2048 × 2048 CCD detector. During data collection the image plates are placed and removed by a robot located inside the hutch using a cassette system. After data collection the image plates are scanned with an off-line drum scanner. Station EH4 is designed for MAD applications, including Xe K-edge anomalous experiments, and is equipped with a 2048 × 2048 CCD detector on a pseudo 2θ arm. A common graphical user interface and a database will be available to cover all aspects of data collection, including strategy optimization. First results on the performance of the optics elements and initial crystallographic results are presented.

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A DOUBLE CRYSTAL MONOCHROMATOR FOR SOFT X-RAY BEAM LINE OF UVSOR

Le Journal de Physique Colloques ◽

10.1051/jphyscol:1986824 ◽

1986 ◽

Vol 47 (C8) ◽

pp. C8-135-C8-137

Author(s):

T. MURATA ◽

T. MATSUKAWA ◽

M. MORI ◽

M. OBASHI ◽

S.-I. NAO-E ◽

...

Keyword(s):

Beam Line ◽

Double Crystal ◽

X Ray ◽

Double Crystal Monochromator

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Estimation of the strain state of GexSi1−x/Si strained-layer superlattices by double-crystal X-ray diffraction

Journal of Crystal Growth ◽

10.1016/0022-0248(94)90099-x ◽

1994 ◽

Vol 141 (1-2) ◽

pp. 103-108

Author(s):

X.F. Duan ◽

K.K. Fung ◽

Y.M. Chu

Keyword(s):

Strain State ◽

X Ray Diffraction ◽

Double Crystal ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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Characterization of Lattice Damage in Ion Implanted Silicon: Monte Carlo Simulation Combined with Double Crystal X-Ray Diffraction

phys stat sol (a) ◽

10.1002/pssa.2210910254 ◽

1985 ◽

Vol 91 (2) ◽

pp. K125-K127 ◽

Cited By ~ 6

Author(s):

F. Cembali ◽

A. M. Mazzone ◽

M. Servidori

Keyword(s):

Monte Carlo Simulation ◽

Monte Carlo ◽

X Ray Diffraction ◽

Double Crystal ◽

X Ray ◽

Lattice Damage ◽

Ion Implanted

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Influence of X-Ray Diffraction Sample Preparation on Quantitative Mineralogy

Journal of Environmental Quality ◽

10.2134/jeq2006.0215 ◽

2007 ◽

Vol 36 (2) ◽

pp. 487-497 ◽

Cited By ~ 15

Author(s):

Dimitris Dermatas ◽

Maria Chrysochoou ◽

Sarra Pardali ◽

Dennis G. Grubb

Keyword(s):

Sample Preparation ◽

X Ray Diffraction ◽

X Ray ◽

Quantitative Mineralogy

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A prototype handheld X-ray diffraction instrument

Journal of Applied Crystallography ◽

10.1107/s1600576718012943 ◽

2018 ◽

Vol 51 (6) ◽

pp. 1571-1585 ◽

Cited By ~ 1

Author(s):

Graeme Hansford

Keyword(s):

Sample Preparation ◽

Mineralogical Composition ◽

General Purpose ◽

Performance Criteria ◽

X Ray Diffraction ◽

X Ray ◽

Fine Grained ◽

Back Reflection ◽

Promising Area ◽

Sample Position

A conceptual design for a handheld X-ray diffraction (HHXRD) instrument is proposed. Central to the design is the application of energy-dispersive XRD (EDXRD) in a back-reflection geometry. This technique brings unique advantages which enable a handheld instrument format, most notably, insensitivity to sample morphology and to the precise sample position relative to the instrument. For fine-grained samples, including many geological specimens and the majority of common alloys, these characteristics negate sample preparation requirements. A prototype HHXRD device has been developed by minor modification of a handheld X-ray fluorescence instrument, and the performance of the prototype has been tested with samples relevant to mining/quarrying and with an extensive range of metal samples. It is shown, for example, that the mineralogical composition of iron-ore samples can be approximately quantified. In metals analysis, identification and quantification of the major phases have been demonstrated, along with extraction of lattice parameters. Texture analysis is also possible and a simple example for a phosphor bronze sample is presented. Instrument formats other than handheld are possible and online process control in metals production is a promising area. The prototype instrument requires extended measurement times but it is argued that a purpose-designed instrument can achieve data-acquisition times below one minute. HHXRD based on back-reflection EDXRD is limited by the low resolution of diffraction peaks and interference by overlapping fluorescence peaks and, for these reasons, cannot serve as a general-purpose XRD tool. However, the advantages ofin situ, nondestructive and rapid measurement, tolerance of irregular surfaces, and no sample preparation requirement in many cases are potentially transformative. For targeted applications in which the analysis meets commercially relevant performance criteria, HHXRD could become the method of choice through sheer speed and convenience.

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