BL-02: a versatile X-ray scattering and diffraction beamline for engineering applications at Indus-2 synchrotron source

2021 ◽  
Vol 28 (4) ◽  
Author(s):  
Pooja Gupta ◽  
P. N. Rao ◽  
M. K. Swami ◽  
A. Bhakar ◽  
Sohan Lal ◽  
...  
Keyword(s):  
Stress Measurement ◽  
Profile Analysis ◽  
Load Capacity ◽  
Design Parameters ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
Engineering Applications ◽  
Texture Measurement ◽  
Synchrotron Source ◽  
X Ray

A hard X-ray engineering applications beamline (BL-02) was commissioned recently and started operation in March 2019 at the Indian synchrotron source, Indus-2. This bending-magnet-based beamline is capable of operating in various beam modes, viz. white, pink and monochromatic beam. The beamline utilizes the X-ray diffraction technique in energy-dispersive and angle-dispersive modes to carry out experiments mainly focused on engineering problems, viz. stress measurement, texture measurement and determination of elastic constants in a variety of bulk as well as thin-film samples. An open-cradle six-circle diffractometer with ∼12 kg load capacity allows accommodation of a wide variety of engineering samples and qualifies the beamline as a unique facility at Indus-2. The high-resolution mode of this beamline is suitably designed so as to carry out line profile analysis for characterization of micro- and nano-structures. In the present article the beamline is described starting from the beamline design, layout, optics involved, various operational modes and experimental stations. Experiments executed to validate the beamline design parameters and to demonstrate the capabilities of the beamline are also described. The future facilities to be incorporated to enhance the capabilities of the beamline are also discussed.

Distributions of Domain Size, Lattice Distortion and Dislocation Density in Tubes of Zr-Based Alloys Studied by a Method Combining X-Ray Line Profile Analysis with Texture Measurements

2004 ◽  
Vol 443-444 ◽  
pp. 255-258 ◽  
Author(s):  
Yuriy Perlovich ◽  
Margarita Isaenkova
Keyword(s):  
Dislocation Density ◽  
Lattice Distortion ◽  
Profile Analysis ◽  
Domain Size ◽  
Line Profile Analysis ◽  
Ray Method ◽  
Texture Measurement ◽  
X Ray ◽  
Pole Figures ◽  
Line Analysis

The distributions of substructure parameters for tubes of Zr-based alloys were constructed by use of the X-ray method of Generalized Pole Figures, combining X-ray line analysis and texture measurement. Obtained distributions cover α-Zr crystallites of all orientations and give the fullest description of substructure features of the studied tubes. The interconnection of different substructure parameters are analyzed.

Defect Structures in Neutron Irradiated 6H-SiC Studied by X-Ray Diffraction Line Profile Analysis

2000 ◽  
Vol 640 ◽  
Author(s):  
C. Seitz ◽  
A. Magerl ◽  
R. Hock ◽  
H. Heissenstein ◽  
R. Helbig
Keyword(s):  
Line Profile ◽  
Correlation Length ◽  
Defect Structure ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
Defect Structures ◽  
X Ray Diffraction ◽  
X Ray ◽  
Annealing Temperatures ◽  
Diffraction Line Profile

ABSTRACTWe have investigated by x-ray diffraction defect structures in 6H-SiC after neutron irradiation with different fluences and followed by different annealing procedures. An interpretation along a model of Klimanek [1, 4–6] shows, that higher fluences lead to a stronger than linear reduction of the correlation length, whereas higher annealing temperatures correlate with a better recovery of the correlation length. In addition defects of 1st kind created by irradiation are reduced by annealing. We find that annealing changes the character of the defects and it accentuates a defect structure already present in the original samples.

X-Ray Diffraction Study of Shock-Modified Tetragonal Phases of SnO2 and MnO2

1992 ◽  
Vol 36 ◽  
pp. 595-601
Author(s):  
P. Newcomer ◽  
B. Morosin ◽  
R. A. Graham
Keyword(s):  
Shock Loading ◽  
Crystal Size ◽  
Lattice Strain ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
Pressure Shock ◽  
X Ray ◽  
Diffraction Line Profile ◽  
Coherent Crystal

AbstractX-ray diffraction line-profile analysis on tetragonal forms of SnO2 (cassiterite), MnO2 (pyrolusite), and previously studied TiO2 (rutile), which were subjected to high pressure shock loading, show that residual lattice strain and coherent “crystal” size are a function of shock parameters. An interesting observation on a sample of MnO2 concerns the recovery of cubic Mn2O3 (bixbyite) in the material subjected to 22 GPa, indicating a shock-induced chemical synthesis.

Dislocation Densities in Dispersion-Strengthened Copper with Aluminum Oxide from X-Ray Line Profile Analysis

2018 ◽  
Vol 941 ◽  
pp. 2024-2029
Author(s):  
Mutsumi Sano ◽  
Sunao Takahashi ◽  
Atsuo Watanabe ◽  
Ayumi Shiro ◽  
Takahisa Shobu ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Aluminum Oxide ◽  
Ambient Temperature ◽  
Line Profile ◽  
Profile Analysis ◽  
Compressive Strain ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Dislocation Densities

Dislocation densities of dispersion-strengthened copper with aluminum oxide, namely GlidCop were evaluated employing the X-ray line profile analysis using the modified Williamson-Hall and modified Warren-Averbach method. X-ray diffraction profiles for GldCop samples with compressive strains applied at ambient temperature were measured with synchrotron radiation. The dislocation densities of GlidCop with compressive strain ranging from 0 – 2.7 % were on the order of 1.5×1014 – 6.6×1014 m-2.

Dislocation densities and crystallite size distributions in nanocrystalline ball-milled fluorides,MF2(M= Ca, Sr, Ba and Cd), determined by X-ray diffraction line-profile analysis

2005 ◽  
Vol 38 (6) ◽  
pp. 912-926 ◽  
Author(s):  
G. Ribárik ◽  
N. Audebrand ◽  
H. Palancher ◽  
T. Ungár ◽  
D. Louër
Keyword(s):  
Crystallite Size ◽  
Line Profile ◽  
Interference Effect ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
Size Distributions ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile ◽  
Dislocation Densities

The dislocation densities and crystallite size distributions in ball-milled fluorides,MF2(M= Ca, Sr, Ba and Cd), of the fluorite structure type have been determined as a function of milling time by X-ray diffraction line-profile analysis. The treatment has been based on the concept of dislocation contrast to explain strain anisotropy by means of the modified Williamson–Hall and Warren–Averbach approaches and a whole-profile fitting method using physically based functions. In most cases, the measured and calculated patterns are in perfect agreement; however, in some specific cases, the first few measured profiles appear to be narrower than the calculated ones. This discrepancy is interpreted as the result of an interference effect similar to that described by Rafaja, Klemm, Schreiber, Knapp & Kužel [J. Appl. Cryst.(2004),37, 613–620]. By taking into account and correcting for this interference effect, the microstructure of ball-milled fluorides is determined in terms of dislocation structure and size distributions of coherent domains. A weak coalescence of the crystallites is observed at longer milling periods. An incubation period in the evolution of microstrains is in correlation with the homologous temperatures of the fluorides.

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