scholarly journals Application of X-ray topography to USSR and Russian space materials science

IUCrJ ◽  
2016 ◽  
Vol 3 (3) ◽  
pp. 200-210 ◽  
Author(s):  
I. L. Shul'pina ◽  
I. A. Prokhorov ◽  
Yu. A. Serebryakov ◽  
I. Zh. Bezbakh
Keyword(s):  
Crystal Growth ◽  
Materials Science ◽  
Perfect Crystal ◽  
Space Vehicles ◽  
X Ray Diffraction ◽  
Semiconductor Crystal ◽  
X Ray ◽  
Diffraction Imaging ◽  
Crystallization Conditions ◽  
Former Ussr

The authors' experience of the application of X-ray diffraction imaging in carrying out space technological experiments on semiconductor crystal growth for the former USSR and for Russia is reported, from the Apollo–Soyuz programme (1975) up to the present day. X-ray topography was applied to examine defects in crystals in order to obtain information on the crystallization conditions and also on their changes under the influence of factors of orbital flight in space vehicles. The data obtained have promoted a deeper understanding of the conditions and mechanisms of crystallization under both microgravity and terrestrial conditions, and have enabled the elaboration of terrestrial methods of highly perfect crystal growth. The use of X-ray topography in space materials science has enriched its methods in the field of digital image processing of growth striations and expanded its possibilities in investigating the inhomogeneity of crystals.

Microstructural characterization using x-ray diffraction imaging

1993 ◽  
Vol 51 ◽  
pp. 504-505
Author(s):  
David R. Black
Keyword(s):  
Lattice Spacing ◽  
Microstructural Characterization ◽  
Perfect Crystal ◽  
Angular Range ◽  
X Ray Diffraction ◽  
Rocking Curve ◽  
X Ray ◽  
Diffraction Imaging ◽  
Point To Point ◽  
Different Parts

X-ray diffraction imaging, also known as x-ray topography, is a powerful tool to study the defect microstructure of single crystals. As the name implies, this technique is based on recording an image of the diffracted x-ray beam from a crystal. Contrast in the image results from point-to-point variation in the diffracted intensity through the crystal. An example of a diffraction image is shown in figure 1. That this image is in some way a topographic representation of the sample can be seen in the impression of differing elevations and textures in different parts of the image. However, since this image is a result of diffraction from the sample the interpretation of the image is much more complex.Diffraction contrast is usually separated into two types: mosaic contrast and extinction contrast. Mosaic contrast occurs for crystals considered to be formed from a collection of small perfect crystal blocks. These blocks have a well defined rocking curve width, the angular range over which they will diffract, and may be slightly misoriented with respect to each other and/or may have different lattice spacing.

X-ray microprobe for materials science

1994 ◽  
Vol 52 ◽  
pp. 56-57
Author(s):  
G.E. Ice
Keyword(s):  
Crystallographic Orientation ◽  
Local Structure ◽  
Materials Science ◽  
Chemical Information ◽  
X Ray Diffraction ◽  
Ray Optics ◽  
X Ray ◽  
Novel Materials ◽  
New Information ◽  
Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

Development of a novel apparatus for experiments in soft X-ray diffraction imaging and diffraction tomography

2003 ◽  
Vol 104 ◽  
pp. 27-30 ◽  
Author(s):  
T. Beetz ◽  
C. Jacobsen ◽  
C.-C. Kao ◽  
J. Kirz ◽  
O. Mentes ◽  
...  
Keyword(s):  
Diffraction Tomography ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Imaging

scholarly journals Simultaneous Multi-Bragg Peak Coherent X-ray Diffraction Imaging

Crystals ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 312
Author(s):  
Florian Lauraux ◽  
Stéphane Labat ◽  
Sarah Yehya ◽  
Marie-Ingrid Richard ◽  
Steven J. Leake ◽  
...  
Keyword(s):  
Bragg Reflection ◽  
Volume Ratio ◽  
X Ray Diffraction ◽  
X Ray ◽  
Crystal Substrate ◽  
In Series ◽  
Diffraction Imaging ◽  
Diffraction Patterns ◽  
Lattice Planes ◽  
Oriented Parallel

The simultaneous measurement of two Bragg reflections by Bragg coherent X-ray diffraction is demonstrated on a twinned Au crystal, which was prepared by the solid-state dewetting of a 30 nm thin gold film on a sapphire substrate. The crystal was oriented on a goniometer so that two lattice planes fulfill the Bragg condition at the same time. The Au 111 and Au 200 Bragg peaks were measured simultaneously by scanning the energy of the incident X-ray beam and recording the diffraction patterns with two two-dimensional detectors. While the former Bragg reflection is not sensitive to the twin boundary, which is oriented parallel to the crystal–substrate interface, the latter reflection is only sensitive to one part of the crystal. The volume ratio between the two parts of the twinned crystal is about 1:9, which is also confirmed by Laue microdiffraction of the same crystal. The parallel measurement of multiple Bragg reflections is essential for future in situ and operando studies, which are so far limited to either a single Bragg reflection or several in series, to facilitate the precise monitoring of both the strain field and defects during the application of external stimuli.

scholarly journals X-ray imaging of silicon die within fully packaged semiconductor devices

2021 ◽  
pp. 1-7
Author(s):  
Brian K. Tanner ◽  
Patrick J. McNally ◽  
Andreas N. Danilewsky
Keyword(s):  
Synchrotron Radiation ◽  
Feasibility Studies ◽  
Monochromatic Radiation ◽  
X Ray Diffraction ◽  
Divergent Beam ◽  
X Ray ◽  
X Ray Imaging ◽  
Setting Process ◽  
Diffraction Imaging ◽  
Lattice Planes

X-ray diffraction imaging (XRDI) (topography) measurements of silicon die warpage within fully packaged commercial quad-flat no-lead devices are described. Using synchrotron radiation, it has been shown that the tilt of the lattice planes in the Analog Devices AD9253 die initially falls, but after 100 °C, it rises again. The twist across the die wafer falls linearly with an increase in temperature. At 200 °C, the tilt varies approximately linearly with position, that is, displacement varies quadratically along the die. The warpage is approximately reversible on cooling, suggesting that it has a simple paraboloidal form prior to encapsulation; the complex tilt and twisting result from the polymer setting process. Feasibility studies are reported, which demonstrate that a divergent beam and quasi-monochromatic radiation from a sealed X-ray tube can be used to perform warpage measurements by XRDI in the laboratory. Existing tools have limitations because of the geometry of the X-ray optics, resulting in applicability only to simple warpage structures. The necessary modifications required for use in situations of complex warpage, for example, in multiple die interconnected packages are specified.

scholarly journals Synthesis of magnesium carbonate hydrate from natural talc

2020 ◽  
Vol 18 (1) ◽  
pp. 951-961
Author(s):  
Qiuju Chen ◽  
Tao Hui ◽  
Hongjuan Sun ◽  
Tongjiang Peng ◽  
Wenjin Ding
Keyword(s):  
Crystal Structure ◽  
Particle Size ◽  
Crystal Growth ◽  
Crystal Morphology ◽  
Magnesium Carbonate ◽  
Organic Additives ◽  
X Ray Diffraction ◽  
Morphological Transformation ◽  
X Ray ◽  
Carbonation Process

AbstractVarious morphologies of magnesium carbonate hydrate had been synthesized without using any organic additives by carefully adjusting the reaction temperature and time during the talc carbonation process. At lower temperatures, magnesium carbonate hydrate was prone to display needle-like morphology. With the further increase of the carbonation temperature, the sheet-like crystallites became the preferred morphology, and at higher aging temperatures, these crystallites tended to assemble into layer-like structures with diverse morphologies, such as rose-like particles and nest-like structure. The reaction time had no effect on the crystal morphology, but it affected the particle size and situation of the crystal growth. X-Ray diffraction results showed that these various morphologies were closely related to their crystal structure and compositions. The needle-like magnesium carbonate hydrate had a formula of MgCO3·3H2O, whereas with the morphological transformation from needle-like to sheet-like, rose-like, and nest-like structure, their corresponding compositions also changed from MgCO3·3H2O to 4MgCO3·Mg(OH)2·8H2O, 4MgCO3·Mg(OH)2·5H2O, and 4MgCO3·Mg(OH)2·4H2O.

Experimental Qualification of a Novel X-Ray Diffraction Imaging Setup Based on Polycapillary X-Ray Optics

2010 ◽  
Vol 57 (5) ◽  
pp. 2564-2570 ◽  
Author(s):  
A. Castoldi ◽  
C. Ozkan ◽  
C. Guazzoni ◽  
A. Bjeoumikhov ◽  
R. Hartmann
Keyword(s):  
X Ray Diffraction ◽  
Ray Optics ◽  
X Ray ◽  
Diffraction Imaging ◽  
Imaging Setup
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