A novel tungsten light-shield structure for high-density CCD image sensors

1991 ◽  
Vol 38 (5) ◽  
pp. 965-968 ◽  
Author(s):  
A. Toyoda ◽  
Y. Suzuki ◽  
K. Orihara ◽  
Y. Hokari
Keyword(s):  
Image Sensors ◽  
High Density ◽  
Ccd Image

Back-illuminated, fully-depleted CCD image sensors for use in optical and near-IR astronomy

2000 ◽  
Vol 442 (1-3) ◽  
pp. 216-222 ◽  
Author(s):  
D.E Groom ◽  
S.E Holland ◽  
M.E Levi ◽  
N.P Palaio ◽  
S Perlmutter ◽  
...  
Keyword(s):  
Image Sensors ◽  
Fully Depleted ◽  
Near Ir ◽  
Ccd Image ◽  
Ir Astronomy ◽  
Back Illuminated

Simulation for estimating smear noise and sensitivity of CCD image sensors having square pixels less than 2.0 μm

2007 ◽  
Author(s):  
Koji Kikuchi ◽  
Shinji Miyazawa ◽  
Yoshinori Uchida ◽  
Hiroe Kamata ◽  
Teruo Hirayama
Keyword(s):  
Image Sensors ◽  
Ccd Image

Advanced complementary color filter technology without dyeing process for CCD image sensors

1998 ◽  
Author(s):  
Hiromitsu Aoki ◽  
Kenji Yokozawa ◽  
Nobuyuki Waga ◽  
Tomoko Ohtagaki ◽  
Yoshiaki Nishi ◽  
...  
Keyword(s):  
Image Sensors ◽  
Color Filter ◽  
Dyeing Process ◽  
Complementary Color ◽  
Ccd Image

Automatic Optical Inspection and Laser Cleaning of Image Sensors

2007 ◽  
Vol 364-366 ◽  
pp. 104-107
Author(s):  
Jong Myoung Lee ◽  
Un Chung Cho
Keyword(s):  
Image Sensors ◽  
Intense Laser ◽  
Laser Shock ◽  
Dry Cleaning ◽  
Image Sensing ◽  
Vision Inspection ◽  
Optical Inspection ◽  
Before And After ◽  
Wave Induced ◽  
Ccd Image

A new dry cleaning methodology named laser shock cleaning and optical inspection technique has been applied not only to remove the particles from the surfaces of image sensors but also to inspect the surfaces automatically before or after the cleaning. In the packaging of CMOS and CCD image sensing modules, the particles generated during the assembly process should be removed from the surfaces of image sensors in order to ensure clear image as well as to enhance the yield. The different kinds of particles were removed from the surfaces by the laser shock cleaning technique which utilizes the airborne shock wave induced by intense laser pulse. For the quantitative evaluation of cleaning performance, number, shape and size of the particles on the surfaces of image sensors were measured by vision inspection technique before and after cleaning. It was found that most particles on the surfaces were successfully removed after the treatment of laser-induced shock waves. The average removal efficiency of the particles was over 95 %. It is interestingly found that the remaining particles after the cleaning are based on organics, which are probably attached during the bonding process.

A Proposal of Analog Correlated Multiple Sampling with High Density Capacitors for Low Noise CMOS Image Sensors

2021 ◽  
Keyword(s):  
International Symposium ◽  
Fast Track ◽  
Low Noise ◽  
Image Sensors ◽  
High Density ◽  
Electronic Imaging ◽  
Multiple Sampling ◽  
Cmos Image Sensors ◽  
Imaging Sensors

Fast track article for IS&T International Symposium on Electronic Imaging 2021: Imaging Sensors and Systems proceedings.

scholarly journals Introduction of CCD Image Sensors

2014 ◽  
Vol 68 (2) ◽  
pp. 145-148
Author(s):  
Nobukazu Teranishi
Keyword(s):  
Image Sensors ◽  
Ccd Image

UV-responsive CCD image sensors with enhanced inorganic phosphor coatings

2003 ◽  
Vol 50 (2) ◽  
pp. 352-358 ◽  
Author(s):  
W.A.R. Franks ◽  
M.J. Kiik ◽  
A. Nathan
Keyword(s):  
Image Sensors ◽  
Ccd Image

Space station application of CCD image sensors for x-ray imaging

1997 ◽  
Author(s):  
John L. Lowrance
Keyword(s):  
Space Station ◽  
Image Sensors ◽  
X Ray ◽  
X Ray Imaging ◽  
Ccd Image

Smart CCD image sensors for optical metrology and machine vision

2002 ◽  
Author(s):  
T. Spirig ◽  
P. Seitz ◽  
O. Vietze
Keyword(s):  
Machine Vision ◽  
Image Sensors ◽  
Optical Metrology ◽  
Ccd Image
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