Channel-length measurement technique based on a floating-gate device

IEEE Electron Device Letters ◽

10.1109/55.737 ◽

1988 ◽

Vol 9 (7) ◽

pp. 340-342 ◽

Author(s):

B. Eitan

Keyword(s):

Measurement Technique ◽

Channel Length ◽

Floating Gate ◽

Length Measurement

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Precise length measurement technique under hydrostatic pressure: Isothermal bulk modulus of PMMA

Review of Scientific Instruments ◽

10.1063/1.1686766 ◽

1974 ◽

Vol 45 (7) ◽

pp. 911-915 ◽

Author(s):

H. A. Spetzler ◽

M. D. Meyer

Keyword(s):

Hydrostatic Pressure ◽

Bulk Modulus ◽

Measurement Technique ◽

Length Measurement ◽

Isothermal Bulk Modulus

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Re: Comparison of a New Length Measurement Technique for Inflatable Penile Prosthesis Implantation to Standard Techniques: Outcomes and Patient Satisfaction

The Journal of Urology ◽

10.1016/j.juro.2011.11.036 ◽

2012 ◽

Vol 187 (3) ◽

pp. 936-936

Author(s):

Allen F. Morey

Keyword(s):

Patient Satisfaction ◽

Measurement Technique ◽

Penile Prosthesis ◽

Length Measurement ◽

Prosthesis Implantation ◽

Inflatable Penile Prosthesis ◽

Standard Techniques

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On the characteristics of polarization-maintaining fibers with the beat-length measurement technique

Microwave and Optical Technology Letters ◽

10.1002/(sici)1098-2760(19961205)13:5<288::aid-mop12>3.0.co;2-3 ◽

1996 ◽

Vol 13 (5) ◽

pp. 288-290

Author(s):

P. K. Shukla ◽

P. K. Choudhury ◽

G. Rai ◽

Jagdish ◽

P. Kala ◽

...

Keyword(s):

Measurement Technique ◽

Length Measurement ◽

Polarization Maintaining

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A SEM-EBIC minority-carrier diffusion-length measurement technique

IEEE Transactions on Electron Devices ◽

10.1109/t-ed.1982.20721 ◽

1982 ◽

Vol 29 (3) ◽

pp. 445-450 ◽

Author(s):

D.E. Ioannou ◽

C.A. Dimitriadis

Keyword(s):

Measurement Technique ◽

Minority Carrier ◽

Diffusion Length ◽

Length Measurement ◽

Minority Carrier Diffusion Length ◽

Carrier Diffusion

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Simple focal-length measurement technique with a circular Dammann grating

Applied Optics ◽

10.1364/ao.46.000044 ◽

2007 ◽

Vol 46 (1) ◽

pp. 44 ◽

Author(s):

Shuai Zhao ◽

Jacky Fung Wen ◽

Po Sheun Chung

Keyword(s):

Measurement Technique ◽

Focal Length ◽

Length Measurement

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Fiber Length Measurement Technique Employing Self-Seeding Laser Oscillation of Fabry–Perot Laser Diode

Japanese Journal of Applied Physics ◽

10.1143/jjap.46.415 ◽

2007 ◽

Vol 46 (1) ◽

pp. 415-416 ◽

Author(s):

Ki-Hong Yoon ◽

Jae-Won Song ◽

Hyun Deok Kim

Keyword(s):

Laser Diode ◽

Measurement Technique ◽

Fiber Length ◽

Length Measurement ◽

Laser Oscillation ◽

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Equivalence and Accuracy of MOSFET Channel Length Measurement Techniques

Japanese Journal of Applied Physics ◽

10.1143/jjap.28.160 ◽

1989 ◽

Vol 28 (Part 1, No. 2) ◽

pp. 160-166 ◽

Author(s):

Sanjay Jain

Keyword(s):

Measurement Techniques ◽

Channel Length ◽

Length Measurement

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Precise focal-length measurement technique with a reflective Fresnel-zone hologram

Applied Optics ◽

10.1364/ao.42.003903 ◽

2003 ◽

Vol 42 (19) ◽

pp. 3903 ◽

Author(s):

Brian DeBoo ◽

Jose Sasian

Keyword(s):

Measurement Technique ◽

Fresnel Zone ◽

Focal Length ◽

Length Measurement

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Effective channel length measurement of metal-oxide-semiconductor transistors with pocket implant using the subthreshold current-voltage characteristics based on remote Coulomb scattering

Applied Physics Letters ◽

10.1063/1.2093943 ◽

2005 ◽

Vol 87 (15) ◽

pp. 153510 ◽

Author(s):

C. W. Eng ◽

W. S. Lau ◽

D. Vigar ◽

S. S. Tan ◽

L. Chan

Keyword(s):

Metal Oxide ◽

Channel Length ◽

Metal Oxide Semiconductor ◽

Length Measurement ◽

Oxide Semiconductor ◽

Coulomb Scattering ◽

Subthreshold Current ◽

Current Voltage ◽

Current Voltage Characteristics ◽

Effective Channel

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The floating gate measurement technique for characterization of capacitor matching

IEEE Transactions on Semiconductor Manufacturing ◽

10.1109/66.484276 ◽

1996 ◽

Vol 9 (1) ◽

pp. 2-8 ◽

Author(s):

H.P. Tuinhout ◽

H. Elzinga ◽

J.T.H. Brugman ◽

F. Postma

Keyword(s):

Measurement Technique ◽

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