Nondestructive defect detection in multilayer ceramic capacitors using an improved digital speckle correlation method with wavelet packet noise reduction processing

2000 ◽  
Vol 23 (1) ◽  
pp. 80-87 ◽  
Author(s):  
Y.C. Chan ◽  
K.C. Hung ◽  
X. Dai
Keyword(s):  
Noise Reduction ◽  
Defect Detection ◽  
Wavelet Packet ◽  
Correlation Method ◽  
Multilayer Ceramic Capacitors ◽  
Digital Speckle Correlation Method ◽  
Speckle Correlation ◽  
Multilayer Ceramic ◽  
Digital Speckle ◽  
Digital Speckle Correlation
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