Nondestructive detection of defects in multilayer ceramic capacitors using an improved digital speckle correlation method with wavelet packet noise reduction processing
2000 ◽
Vol 23
(1)
◽
pp. 80-87
◽
1997 ◽
Vol 16
(2)
◽
pp. 80-85
◽
1995 ◽
Vol 18
(3)
◽
pp. 677-684
◽
2006 ◽
pp. 1117-1120
◽