A new technique for measuring the mechanical properties of thin films

1997 ◽  
Vol 6 (3) ◽  
pp. 193-199 ◽  
Author(s):  
W.N. Sharpe ◽  
B. Yuan ◽  
R.L. Edwards
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
New Technique ◽  
A New Technique

Mechanical deflection of cantilever microbeams: A new technique for testing the mechanical properties of thin films

1988 ◽  
Vol 3 (5) ◽  
pp. 931-942 ◽  
Author(s):  
T. P. Weihs ◽  
S. Hong ◽  
J. C. Bravman ◽  
W. D. Nix
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Mechanical Properties ◽  
Single Layer ◽  
Beam Theory ◽  
New Technique ◽  
Young’S Moduli ◽  
Silicon Micromachining ◽  
A New Technique

The mechanical deflection of cantilever microbeams is presented as a new technique for testing the mechanical properties of thin films. Single-layer microbeams of Au and SiO2 have been fabricated using conventional silicon micromachining techniques. Typical thickness, width, and length dimensions of the beams are 1.0,20, and 30 μm, respectively. The beams are mechanically deflected by a Nanoindenter, a submicron indentation instrument that continuously monitors load and deflection. Using simple beam theory and the load-deflection data, the Young's moduli and the yield strengths of thin-film materials that comprise the beams are determined. The measured mechanical properties are compared to those obtained by indenting similar thin films supported by their substrate.

A new technique for testing the impact load of thin films: the coating impact test

1992 ◽  
pp. 102-107 ◽  
Author(s):  
O. Knotek ◽  
B. Bosserhoff ◽  
A. Schrey ◽  
T. Leyendecker ◽  
O. Lemmer ◽  
...  
Keyword(s):  
Thin Films ◽  
Impact Test ◽  
Impact Load ◽  
New Technique ◽  
A New Technique ◽  
The Impact

A new technique for characterization of pore structures in materials—application to the study of hydroxyapatite thin films

1998 ◽  
Vol 37 (4-5) ◽  
pp. 211-214
Author(s):  
C.M. Lopatin ◽  
T.L. Alford ◽  
V.B. Pizziconi ◽  
T. Laursen
Keyword(s):  
Thin Films ◽  
New Technique ◽  
Pore Structures ◽  
A New Technique

Interfacial Free Energies and the Creep of Multilayer Thin Films

1997 ◽  
Vol 505 ◽  
Author(s):  
D. Josell ◽  
W. C. Carter
Keyword(s):  
Thin Films ◽  
New Technique ◽  
Multilayer Thin Films ◽  
Free Energies ◽  
Creep Properties ◽  
Multilayer Foils ◽  
A New Technique ◽  
Interfacial Free Energies

ABSTRACTExperiments utilizing the creep properties of multilayer thin films to determine interfacial free energies are presented with essential theory. A new technique utilizing tubular multilayer foils is then described.

A New Technique for Determination of Tensile Stress in Thin Films

1989 ◽  
Vol 136 (5) ◽  
pp. 1566-1568 ◽  
Author(s):  
Keith E. Crowe ◽  
Rosemary L. Smith
Keyword(s):  
Thin Films ◽  
Tensile Stress ◽  
New Technique ◽  
A New Technique

scholarly journals Quasi-Rheotaxy a new technique to grow large grain thin films on low cost amorphous substrates

1981 ◽  
Vol 16 (1) ◽  
pp. 11-14 ◽  
Author(s):  
N. Romeo ◽  
V. Canevari ◽  
G. Sberveglieri ◽  
A. Tosi ◽  
A. Camanzi
Keyword(s):  
Thin Films ◽  
Low Cost ◽  
New Technique ◽  
Amorphous Substrates ◽  
A New Technique
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