Interfacial Free Energies and the Creep of Multilayer Thin Films

1997 ◽  
Vol 505 ◽  
Author(s):  
D. Josell ◽  
W. C. Carter
Keyword(s):  
Thin Films ◽  
New Technique ◽  
Multilayer Thin Films ◽  
Free Energies ◽  
Creep Properties ◽  
Multilayer Foils ◽  
A New Technique ◽  
Interfacial Free Energies

ABSTRACTExperiments utilizing the creep properties of multilayer thin films to determine interfacial free energies are presented with essential theory. A new technique utilizing tubular multilayer foils is then described.

Determining Interfacial Free Energies from Creep Experiments on Silver-Iron Multilayers

1994 ◽  
Vol 356 ◽  
Author(s):  
D. Josell ◽  
Z.L. Wang
Keyword(s):  
Thin Films ◽  
Free Energy ◽  
Boundary Diffusion ◽  
Interfacial Free Energy ◽  
Multilayer Thin Films ◽  
Free Energies ◽  
Diffusion Controlled ◽  
Interfacial Free Energies ◽  
Over Time ◽  
Microstructural Data

AbstractExperiments were conducted on multilayer thin films to determine the free energies associated with silver/iron interfaces. Creep studies determined the loads for which the multilayers neither shrank nor stretched over time. Microstructural data was used with the zero creep loads in a model for grain boundary diffusion controlled creep in multilayers to determine the interfacial free energy.

A new technique for testing the impact load of thin films: the coating impact test

1992 ◽  
pp. 102-107 ◽  
Author(s):  
O. Knotek ◽  
B. Bosserhoff ◽  
A. Schrey ◽  
T. Leyendecker ◽  
O. Lemmer ◽  
...  
Keyword(s):  
Thin Films ◽  
Impact Test ◽  
Impact Load ◽  
New Technique ◽  
A New Technique ◽  
The Impact

Mechanical deflection of cantilever microbeams: A new technique for testing the mechanical properties of thin films

1988 ◽  
Vol 3 (5) ◽  
pp. 931-942 ◽  
Author(s):  
T. P. Weihs ◽  
S. Hong ◽  
J. C. Bravman ◽  
W. D. Nix
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Mechanical Properties ◽  
Single Layer ◽  
Beam Theory ◽  
New Technique ◽  
Young’S Moduli ◽  
Silicon Micromachining ◽  
A New Technique

The mechanical deflection of cantilever microbeams is presented as a new technique for testing the mechanical properties of thin films. Single-layer microbeams of Au and SiO2 have been fabricated using conventional silicon micromachining techniques. Typical thickness, width, and length dimensions of the beams are 1.0,20, and 30 μm, respectively. The beams are mechanically deflected by a Nanoindenter, a submicron indentation instrument that continuously monitors load and deflection. Using simple beam theory and the load-deflection data, the Young's moduli and the yield strengths of thin-film materials that comprise the beams are determined. The measured mechanical properties are compared to those obtained by indenting similar thin films supported by their substrate.

A new technique for characterization of pore structures in materials—application to the study of hydroxyapatite thin films

1998 ◽  
Vol 37 (4-5) ◽  
pp. 211-214
Author(s):  
C.M. Lopatin ◽  
T.L. Alford ◽  
V.B. Pizziconi ◽  
T. Laursen
Keyword(s):  
Thin Films ◽  
New Technique ◽  
Pore Structures ◽  
A New Technique

Studies of Ag/Fe Interfacial Free Energies by Biaxial Zero Creep Experiments

2003 ◽  
Vol 10 (05) ◽  
pp. 763-769 ◽  
Author(s):  
Bing An ◽  
Tong-Jun Zhang ◽  
Chao Yuan ◽  
Kun Cui
Keyword(s):  
Rf Magnetron Sputtering ◽  
Film Stress ◽  
Multilayer Thin Films ◽  
Free Energies ◽  
Stress Monitoring ◽  
Isothermal Process ◽  
Long Duration ◽  
Grain Distribution ◽  
Interface Free Energy ◽  
Interfacial Free Energies

Biaxial zero creep experiments based on the Josell model were performed on Ag/Fe multilayer thin films to determine their interfacial free energies. Various multilayer samples on stiff wafers prepared by RF magnetron sputtering were subjected to annealing of long duration at 550°C, while a substrate curvature technique was employed for real-time film stress monitoring. Sufficient plastic flow in films makes possible a zero creep equilibrium state to present during this isothermal process, and as a result the interfacial free energies in multilayer interfaces are equilibrated with the elastic strain energies arising from the substrate bending. There is no collapse in the annealed multilayer structures. They are still stably layer-built and exhibit a column grain distribution. XRD results show that Ag and Fe layers have (111) and (110) preferred orientations, respectively. In accordance with a revised Josell model, the equilibrium stresses were measured and the Ag (111)/ Fe (110) interface free energy at 550°C was found to be 0.97 ± 0.13 J/m 2.

A new technique for measuring the mechanical properties of thin films

1997 ◽  
Vol 6 (3) ◽  
pp. 193-199 ◽  
Author(s):  
W.N. Sharpe ◽  
B. Yuan ◽  
R.L. Edwards
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
New Technique ◽  
A New Technique

A New Technique for Determination of Tensile Stress in Thin Films

1989 ◽  
Vol 136 (5) ◽  
pp. 1566-1568 ◽  
Author(s):  
Keith E. Crowe ◽  
Rosemary L. Smith
Keyword(s):  
Thin Films ◽  
Tensile Stress ◽  
New Technique ◽  
A New Technique

scholarly journals Quasi-Rheotaxy a new technique to grow large grain thin films on low cost amorphous substrates

1981 ◽  
Vol 16 (1) ◽  
pp. 11-14 ◽  
Author(s):  
N. Romeo ◽  
V. Canevari ◽  
G. Sberveglieri ◽  
A. Tosi ◽  
A. Camanzi
Keyword(s):  
Thin Films ◽  
Low Cost ◽  
New Technique ◽  
Amorphous Substrates ◽  
A New Technique
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