Latent open defect detection using phase-sensitive nonlinearity detection technique

IEEE Transactions on Components Packaging and Manufacturing Technology Part B ◽

10.1109/96.386274 ◽

1995 ◽

Vol 18 (2) ◽

pp. 358-365 ◽

Author(s):

A. Halperin ◽

T.H. DiStefano ◽

Shinwu Chiang

Keyword(s):

Defect Detection ◽

Detection Technique ◽

Phase Sensitive ◽

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On-Chip Area and Test Time Effective Weak Resistive Open Defect Detection Technique for Cache Memory

2021 IEEE 12th Latin America Symposium on Circuits and System (LASCAS) ◽

10.1109/lascas51355.2021.9459175 ◽

2021 ◽

Author(s):

Sheetal Barekar ◽

Madan Mali

Keyword(s):

Defect Detection ◽

Detection Technique ◽

Cache Memory ◽

Test Time ◽

Chip Area ◽

Open Defect ◽

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Latent open defect detection using phase-sensitive nonlinearity detection technqiue

Microelectronics Reliability ◽

10.1016/0026-2714(96)84402-7 ◽

1996 ◽

Vol 36 (4) ◽

pp. 539

Keyword(s):

Defect Detection ◽

Phase Sensitive ◽

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A new passive defect detection technique based on the principle of strain compatibility

Smart Materials and Structures ◽

10.1088/0964-1726/17/4/045004 ◽

2008 ◽

Vol 17 (4) ◽

pp. 045004 ◽

Author(s):

S J Wildy ◽

A G Kotousov ◽

J D Codrington

Keyword(s):

Defect Detection ◽

Detection Technique ◽

Strain Compatibility

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Defect Detection Technique Based on Similarity Comparison of Token

Journal of Applied Sciences ◽

10.3923/jas.2013.4270.4277 ◽

2013 ◽

Vol 13 (20) ◽

pp. 4270-4277

Author(s):

Guo Tao ◽

Dong Guowei ◽

Qin Hu ◽

Long Baolian ◽

Qu Tong ◽

...

Keyword(s):

Defect Detection ◽

Detection Technique ◽

Similarity Comparison

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CMOS open defect detection by supply current test

Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001 ◽

10.1109/date.2001.915071 ◽

2002 ◽

Author(s):

M. Hashizume ◽

M. Ichimiya ◽

H. Yotsuyanagi ◽

T. Tamesada

Keyword(s):

Defect Detection ◽

Current Test ◽

Open Defect ◽

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Reverse Analysis Method of Static XSS Defect Detection Technique Based on Database Query Language

2014 Ninth International Conference on P2P, Parallel, Grid, Cloud and Internet Computing ◽

10.1109/3pgcic.2014.99 ◽

2014 ◽

Author(s):

Cui Baojiang ◽

Long Baolian ◽

Hou Tingting

Keyword(s):

Defect Detection ◽

Query Language ◽

Detection Technique ◽

Analysis Method ◽

Database Query ◽

Reverse Analysis ◽

Database Query Language

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A new methodology for realistic open defect detection probability evaluation under process variations

29th VLSI Test Symposium ◽

10.1109/vts.2011.5783781 ◽

2011 ◽

Author(s):

Jesus Moreno ◽

Victor Champac ◽

Michel Renovell

Keyword(s):

Defect Detection ◽

Detection Probability ◽

Process Variations ◽

Probability Evaluation ◽

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BICS-based March test for resistive-open defect detection in SRAMs

2010 11th Latin American Test Workshop ◽

10.1109/latw.2010.5550342 ◽

2010 ◽

Author(s):

R. Chipana ◽

L. Bolzani ◽

F. Vargas

Keyword(s):

Defect Detection ◽

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Empirical assessment of a defect detection technique for use cases

"Second Workshop on Software Quality" W13S Workshop - 26th International Conference on Software Engineering ◽

10.1049/ic:20040331 ◽

2004 ◽

Author(s):

B. Bernardez

Keyword(s):

Defect Detection ◽

Use Cases ◽

Detection Technique ◽

Empirical Assessment

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Straightness measurement system based on phase sensitive detection technique

10.1117/12.2036576 ◽

2013 ◽

Author(s):

Pei Huang ◽

Yan Li ◽

Haoyun Wei

Keyword(s):

Measurement System ◽

Detection Technique ◽

Sensitive Detection ◽

Phase Sensitive ◽

Phase Sensitive Detection ◽

Sensitive Detection Technique

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