CMOS open defect detection by supply current test

Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001 ◽

10.1109/date.2001.915071 ◽

2002 ◽

Author(s):

M. Hashizume ◽

M. Ichimiya ◽

H. Yotsuyanagi ◽

T. Tamesada

Keyword(s):

Defect Detection ◽

Current Test ◽

Open Defect ◽

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CMOS open defect detection based on supply current in time-variable electric field and supply voltage application

Proceedings 10th Asian Test Symposium ◽

10.1109/ats.2001.990269 ◽

2002 ◽

Author(s):

M. Hashizume ◽

M. Ichimiya ◽

H. Yotsuyanagi ◽

T. Tamesada

Keyword(s):

Electric Field ◽

Defect Detection ◽

Supply Voltage ◽

Time Variable ◽

Variable Electric Field ◽

Voltage Application ◽

Open Defect ◽

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On-Chip Area and Test Time Effective Weak Resistive Open Defect Detection Technique for Cache Memory

2021 IEEE 12th Latin America Symposium on Circuits and System (LASCAS) ◽

10.1109/lascas51355.2021.9459175 ◽

2021 ◽

Author(s):

Sheetal Barekar ◽

Madan Mali

Keyword(s):

Defect Detection ◽

Detection Technique ◽

Cache Memory ◽

Test Time ◽

Chip Area ◽

Open Defect ◽

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Supply current test for unit-to-unit variations of electrical characteristics in gates

Proceedings Sixth Asian Test Symposium (ATS'97) ◽

10.1109/ats.1997.643985 ◽

2002 ◽

Author(s):

M. Hashizume ◽

T. Kuchii ◽

T. Tamesada

Keyword(s):

Electrical Characteristics ◽

Current Test ◽

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Latent open defect detection using phase-sensitive nonlinearity detection technqiue

Microelectronics Reliability ◽

10.1016/0026-2714(96)84402-7 ◽

1996 ◽

Vol 36 (4) ◽

pp. 539

Keyword(s):

Defect Detection ◽

Phase Sensitive ◽

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DEFECT DETECTION AND EVALUATION USING A COMPUTER CONTROLED PULSED EDDY CURRENT TEST EQUIPMENT

Non-Destructive Testing ◽

10.1016/b978-0-444-87450-4.50075-8 ◽

1989 ◽

pp. 305-310 ◽

Author(s):

P. WEBER ◽

Y. JAYET ◽

F. PONS

Keyword(s):

Defect Detection ◽

Eddy Current ◽

Test Equipment ◽

Eddy Current Test ◽

Current Test ◽

Pulsed Eddy Current

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Catastrophic and parametric fault detection by dynamic power supply current test

10.1049/ic:19971201 ◽

1997 ◽

Author(s):

S. Bracho

Keyword(s):

Fault Detection ◽

Power Supply ◽

Dynamic Power ◽

Current Test ◽

Parametric Fault ◽

Supply Current ◽

Dynamic Power Supply Current

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Latent open defect detection using phase-sensitive nonlinearity detection technique

IEEE Transactions on Components Packaging and Manufacturing Technology Part B ◽

10.1109/96.386274 ◽

1995 ◽

Vol 18 (2) ◽

pp. 358-365 ◽

Author(s):

A. Halperin ◽

T.H. DiStefano ◽

Shinwu Chiang

Keyword(s):

Defect Detection ◽

Detection Technique ◽

Phase Sensitive ◽

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A new methodology for realistic open defect detection probability evaluation under process variations

29th VLSI Test Symposium ◽

10.1109/vts.2011.5783781 ◽

2011 ◽

Author(s):

Jesus Moreno ◽

Victor Champac ◽

Michel Renovell

Keyword(s):

Defect Detection ◽

Detection Probability ◽

Process Variations ◽

Probability Evaluation ◽

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BICS-based March test for resistive-open defect detection in SRAMs

2010 11th Latin American Test Workshop ◽

10.1109/latw.2010.5550342 ◽

2010 ◽

Author(s):

R. Chipana ◽

L. Bolzani ◽

F. Vargas

Keyword(s):

Defect Detection ◽

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A built-in supply current test circuit for electrical interconnect tests of 3D ICs

2014 International 3D Systems Integration Conference (3DIC) ◽

10.1109/3dic.2014.7152148 ◽

2014 ◽

Author(s):

Masaki Hashizume ◽

Shoichi Umezu ◽

Hiroyuki Yotsuyanagi ◽

Shyue-Kung Lu

Keyword(s):

Current Test ◽

3D Ics ◽

Test Circuit ◽

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