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Latent open defect detection using phase-sensitive nonlinearity detection technqiue
Microelectronics Reliability
◽
10.1016/0026-2714(96)84402-7
◽
1996
◽
Vol 36
(4)
◽
pp. 539
Keyword(s):
Defect Detection
◽
Phase Sensitive
◽
Open Defect
Download Full-text
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Cited By
References
Latent open defect detection using phase-sensitive nonlinearity detection technique
IEEE Transactions on Components Packaging and Manufacturing Technology Part B
◽
10.1109/96.386274
◽
1995
◽
Vol 18
(2)
◽
pp. 358-365
◽
Cited By ~ 3
Author(s):
A. Halperin
◽
T.H. DiStefano
◽
Shinwu Chiang
Keyword(s):
Defect Detection
◽
Detection Technique
◽
Phase Sensitive
◽
Open Defect
Download Full-text
On-Chip Area and Test Time Effective Weak Resistive Open Defect Detection Technique for Cache Memory
2021 IEEE 12th Latin America Symposium on Circuits and System (LASCAS)
◽
10.1109/lascas51355.2021.9459175
◽
2021
◽
Author(s):
Sheetal Barekar
◽
Madan Mali
Keyword(s):
Defect Detection
◽
Detection Technique
◽
Cache Memory
◽
Test Time
◽
Chip Area
◽
Open Defect
◽
On Chip
Download Full-text
CMOS open defect detection by supply current test
Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001
◽
10.1109/date.2001.915071
◽
2002
◽
Cited By ~ 11
Author(s):
M. Hashizume
◽
M. Ichimiya
◽
H. Yotsuyanagi
◽
T. Tamesada
Keyword(s):
Defect Detection
◽
Current Test
◽
Open Defect
◽
Supply Current
Download Full-text
A new methodology for realistic open defect detection probability evaluation under process variations
29th VLSI Test Symposium
◽
10.1109/vts.2011.5783781
◽
2011
◽
Cited By ~ 5
Author(s):
Jesus Moreno
◽
Victor Champac
◽
Michel Renovell
Keyword(s):
Defect Detection
◽
Detection Probability
◽
Process Variations
◽
Probability Evaluation
◽
Open Defect
Download Full-text
BICS-based March test for resistive-open defect detection in SRAMs
2010 11th Latin American Test Workshop
◽
10.1109/latw.2010.5550342
◽
2010
◽
Cited By ~ 1
Author(s):
R. Chipana
◽
L. Bolzani
◽
F. Vargas
Keyword(s):
Defect Detection
◽
March Test
◽
Open Defect
Download Full-text
Open Defect Detection of Through Silicon Vias for Structural Power Integrity Test of 3D-ICs
2019 IEEE 23rd Workshop on Signal and Power Integrity (SPI)
◽
10.1109/sapiw.2019.8781656
◽
2019
◽
Cited By ~ 1
Author(s):
Koutaro Hachiya
◽
Atshushi Kurokawa
Keyword(s):
Defect Detection
◽
Power Integrity
◽
Integrity Test
◽
Structural Power
◽
Through Silicon Vias
◽
3D Ics
◽
Open Defect
◽
Silicon Vias
Download Full-text
CMOS open defect detection based on supply current in time-variable electric field and supply voltage application
Proceedings 10th Asian Test Symposium
◽
10.1109/ats.2001.990269
◽
2002
◽
Cited By ~ 1
Author(s):
M. Hashizume
◽
M. Ichimiya
◽
H. Yotsuyanagi
◽
T. Tamesada
Keyword(s):
Electric Field
◽
Defect Detection
◽
Supply Voltage
◽
Time Variable
◽
Variable Electric Field
◽
Voltage Application
◽
Open Defect
◽
Supply Current
Download Full-text
New test methodology for resistive open defect detection in memory address decoders
22nd IEEE VLSI Test Symposium, 2004. Proceedings.
◽
10.1109/vtest.2004.1299235
◽
2004
◽
Cited By ~ 21
Author(s):
M. Azimane
◽
A.K. Majhi
Keyword(s):
Defect Detection
◽
Test Methodology
◽
Memory Address
◽
Open Defect
◽
Address Decoders
Download Full-text
Open Defect Detection with a Built-in Test Circuit by IDDT Appearance Time in CMOS ICs
2017 IEEE 26th Asian Test Symposium (ATS)
◽
10.1109/ats.2017.53
◽
2017
◽
Author(s):
Ayumu Kambara
◽
Hiroyuki Yotsuyanagi
◽
Daichi Miyoshi
◽
Masaki Hashizume
◽
Shyue-Kung Lu
Keyword(s):
Defect Detection
◽
Appearance Time
◽
Test Circuit
◽
Open Defect
Download Full-text
Open Defect Detection Not Utilizing Boundary Scan Flip-Flops in Assembled Circuit Boards
IEEE Transactions on Components Packaging and Manufacturing Technology
◽
10.1109/tcpmt.2020.2973182
◽
2020
◽
Vol 10
(5)
◽
pp. 895-907
Author(s):
Michiya Kanda
◽
Masaki Hashizume
◽
Fara Ashikin Binti ALI
◽
Hiroyuki Yotsuyanagi
◽
Shyue-Kung Lu
Keyword(s):
Defect Detection
◽
Boundary Scan
◽
Circuit Boards
◽
Open Defect
Download Full-text
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