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Testable Design for Electrical Testing of Open Defects at Interconnects in 3D ICs
2013 22nd Asian Test Symposium
◽
10.1109/ats.2013.13
◽
2013
◽
Cited By ~ 2
Author(s):
Masaki Hashizume
◽
Tomoaki Konishi
◽
Hiroyuki Yotsuyanag
◽
Shyue-Kung Lu
Keyword(s):
3D Ics
◽
Open Defects
◽
Testable Design
Download Full-text
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References
A built-in test circuit for supply current testing of open defects at interconnects in 3D ICs
2012 4th Electronic System-Integration Technology Conference
◽
10.1109/estc.2012.6542127
◽
2012
◽
Cited By ~ 10
Author(s):
Tomoaki Konishi
◽
Hiroyuki Yotsuyanagi
◽
Masaki Hashizume
Keyword(s):
Current Testing
◽
3D Ics
◽
Test Circuit
◽
Supply Current
◽
Open Defects
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A built-in defective level monitor of resistive open defects in 3D ICs with logic gates
2016 IEEE CPMT Symposium Japan (ICSJ)
◽
10.1109/icsj.2016.7801299
◽
2016
◽
Cited By ~ 1
Author(s):
Masaki Hashizume
◽
Akihiro Odoriba
◽
Hiroyuki Yotsuyanagi
◽
Shyue-Kung Lu
Keyword(s):
Logic Gates
◽
3D Ics
◽
Open Defects
◽
Resistive Open Defects
Download Full-text
Testability for resistive open defects by electrical interconnect test of 3D ICs without boundary scan flip flops
2016 IEEE CPMT Symposium Japan (ICSJ)
◽
10.1109/icsj.2016.7801302
◽
2016
◽
Author(s):
Fara Ashikin Binti Ali
◽
Masaki Hashizume
◽
Yuki Ikiri
◽
Hiroyuki Yotsuyanagi
◽
Shyue-Kung Lu
Keyword(s):
Boundary Scan
◽
3D Ics
◽
Interconnect Test
◽
Open Defects
◽
Resistive Open Defects
Download Full-text
A defective level monitor of open defects in 3D ICs with a comparator of offset cancellation type
2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
◽
10.1109/dft.2017.8244446
◽
2017
◽
Cited By ~ 2
Author(s):
Michiya Kanda
◽
Masaki Hashizume
◽
Hiroyuki Yotsuyanagi
◽
Shyue-Kung Lu
Keyword(s):
Offset Cancellation
◽
3D Ics
◽
Open Defects
Download Full-text
DFT for supply current testing to detect open defects at interconnects in 3D ICs
2013 IEEE Electrical Design of Advanced Packaging Systems Symposium (EDAPS)
◽
10.1109/edaps.2013.6724389
◽
2013
◽
Cited By ~ 3
Author(s):
Shohei Suenaga
◽
Masaki Hashizume
◽
Hiroyuki Yotsuyanagi
◽
Shyue-Kung Lu
◽
Zvi Roth
Keyword(s):
Current Testing
◽
3D Ics
◽
Supply Current
◽
Open Defects
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Supply current testing of open defects at interconnects in 3D Ics with IEEE 1149.1 architecture
2011 IEEE International 3D Systems Integration Conference (3DIC), 2011 IEEE International
◽
10.1109/3dic.2012.6262968
◽
2012
◽
Cited By ~ 12
Author(s):
Tomoaki Konishi
◽
Hiroyuki Yotsuyanagi
◽
Masaki Hashizume
Keyword(s):
Current Testing
◽
3D Ics
◽
Supply Current
◽
Ieee 1149.1
◽
Open Defects
Download Full-text
Electrical Test Method for Interconnect Open Defects in 3D ICs
Transactions of The Japan Institute of Electronics Packaging
◽
10.5104/jiepeng.5.26
◽
2012
◽
Vol 5
(1)
◽
pp. 26-33
◽
Cited By ~ 3
Author(s):
Tomoaki Konishi
◽
Hiroyuki Yotsuyanagi
◽
Masaki Hashizume
Keyword(s):
Test Method
◽
Electrical Test
◽
3D Ics
◽
Open Defects
Download Full-text
A testable design for electrical interconnect tests of 3D ICs
2015 International Conference on Electronic Packaging and iMAPS All Asia Conference (ICEP-IAAC)
◽
10.1109/icep-iaac.2015.7111105
◽
2015
◽
Author(s):
Akihiro Odoriba
◽
Shoichi Umezu
◽
Masaki Hashizume
◽
Hiroyuki Yotsuyanagi
◽
Fara Ashikin Binti Ali
◽
...
Keyword(s):
3D Ics
◽
Testable Design
Download Full-text
A built-in test circuit for open defects at interconnects between dies in 3D ICs
2011 IEEE International 3D Systems Integration Conference (3DIC), 2011 IEEE International
◽
10.1109/3dic.2012.6263041
◽
2012
◽
Cited By ~ 1
Author(s):
Widianto
◽
Hiroyuki Yotsuyanagi
◽
Akira Ono
◽
Masao Takagi
◽
Masaki Hashizume
Keyword(s):
3D Ics
◽
Test Circuit
◽
Open Defects
Download Full-text
Resistive open defects detected by interconnect testing based on charge volume injected to 3D ICs
2017 IEEE CPMT Symposium Japan (ICSJ)
◽
10.1109/icsj.2017.8240124
◽
2017
◽
Author(s):
Kouhei Ohtani
◽
Naho Osato
◽
Masaki Hashizume
◽
Hiroyuki Yotsuyanagi
◽
Shyue-Kung Lu
Keyword(s):
Interconnect Testing
◽
3D Ics
◽
Open Defects
◽
Resistive Open Defects
Download Full-text
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