Next Generation Test Library for RF SOC on ATE

2021 China Semiconductor Technology International Conference (CSTIC) ◽

10.1109/cstic52283.2021.9461580 ◽

2021 ◽

Author(s):

Ping Wang ◽

Haocheng Yuan ◽

Vincent Lin ◽

Haixia Guo ◽

Goh Frank

Keyword(s):

Next Generation ◽

Generation Test

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IBIST/sup TM/ (interconnect built-in self-test) architecture and methodology for pci express: intel's next-generation test and validation methodology for performance IO

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1270909 ◽

2004 ◽

Author(s):

J.J. Nejedlo

Keyword(s):

Next Generation ◽

Pci Express ◽

Self Test ◽

Built In Self Test ◽

Test Architecture ◽

Generation Test

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Catching up with the real world: requirements for next-generation test instruments

IEEE Autotestcon, 2005. ◽

10.1109/autest.2005.1609195 ◽

2006 ◽

Author(s):

E. Truebenbach

Keyword(s):

Next Generation ◽

The Real ◽

Catching Up ◽

Generation Test

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IVI revisited: Building next-generation test systems with open FPGAs while preserving software APIs

2013 IEEE AUTOTESTCON ◽

10.1109/autest.2013.6645038 ◽

2013 ◽

Author(s):

Ryan Verret

Keyword(s):

Next Generation ◽

Test Systems ◽

Generation Test

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Next generation test support systems for the aircraft life cycle

2001 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. (Cat. No.01CH37237) ◽

10.1109/autest.2001.949473 ◽

2002 ◽

Author(s):

E. Baltes

Keyword(s):

Support Systems ◽

Next Generation ◽

Generation Test

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Next-generation test equipment for high-volume wafer production

SPIE Newsroom ◽

10.1117/2.1201003.002684 ◽

2010 ◽

Author(s):

Kay Gastinger

Keyword(s):

High Volume ◽

Test Equipment ◽

Next Generation ◽

Generation Test

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Signal Based Domain Specific Language (SBDSL) a proposal for a next generation test

2011 IEEE AUTOTESTCON ◽

10.1109/autest.2011.6058739 ◽

2011 ◽

Author(s):

William J Headrick ◽

Michael A Bodkin ◽

Robert R Fox ◽

Timothy W Davis ◽

Kevin Dusch ◽

...

Keyword(s):

Domain Specific Language ◽

Next Generation ◽

Specific Language ◽

Domain Specific ◽

Generation Test

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Tribute board and platform test methodology: intel's next generation test and validation methodology for platforms

International Test Conference, 2003. Proceedings. ITC 2003. ◽

10.1109/test.2003.1270908 ◽

2004 ◽

Author(s):

J.J. Nejedlo

Keyword(s):

Next Generation ◽

Test Methodology ◽

Generation Test

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Next Generation Test Generator (NGTG) for digital circuits

1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century ◽

10.1109/autest.1997.633572 ◽

2002 ◽

Author(s):

S. Singer ◽

L. Vanetsky

Keyword(s):

Digital Circuits ◽

Next Generation ◽

Generation Test

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Orbiting space laboratories - The next generation test facility

10.2514/6.1967-814 ◽

1967 ◽

Author(s):

E. FRIED

Keyword(s):

Test Facility ◽

Next Generation ◽

Generation Test

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Next generation test system architectures for Depot and O-level test

2011 IEEE AUTOTESTCON ◽

10.1109/autest.2011.6058758 ◽

2011 ◽

Author(s):

Jim Ginn ◽

Michael Dewey

Keyword(s):

Test System ◽

Next Generation ◽

System Architectures ◽

Generation Test

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