Characterization of high-voltage charge-trapping effects in GaN-based power HEMTs

2014 44th European Solid State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2014.6948842 ◽

2014 ◽

Author(s):

D. Bisi ◽

A. Stocco ◽

M. Meneghini ◽

F. Rampazzo ◽

A. Cester ◽

...

Keyword(s):

High Voltage ◽

Charge Trapping ◽

Trapping Effects

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Thermal characterization of nonlinear charge trapping effects in GaN-FETs

2014 International Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits (INMMiC) ◽

10.1109/inmmic.2014.6815103 ◽

2014 ◽

Author(s):

Gian Piero Gibiino ◽

Rafael Cignani ◽

Daniel Niessen ◽

Dominique Schreurs ◽

Alberto Santarelli ◽

...

Keyword(s):

Charge Trapping ◽

Thermal Characterization ◽

Trapping Effects

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Characterization of charge-trapping effects in GaN FETs through low-frequency measurements

2014 International Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits (INMMiC) ◽

10.1109/inmmic.2014.6815078 ◽

2014 ◽

Author(s):

Gianni Bosi ◽

Antonio Raffo ◽

Andrea Nalli ◽

Valeria Vadala ◽

Giorgio Vannini

Keyword(s):

Low Frequency ◽

Charge Trapping ◽

Frequency Measurements ◽

Trapping Effects

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Characterization of 2-substituted pyridinium salts by high-voltage paper electrophoresis

Fresenius Zeitschrift für Analytische Chemie ◽

10.1007/bf00556057 ◽

1985 ◽

Vol 320 (8) ◽

pp. 776-776 ◽

Author(s):

E. Bald

Keyword(s):

High Voltage ◽

Paper Electrophoresis ◽

Pyridinium Salts

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Characterization of High-Voltage SiC MOSFETs under UIS Avalanche Stress

7th IET International Conference on Power Electronics, Machines and Drives (PEMD 2014) ◽

10.1049/cp.2014.0374 ◽

2014 ◽

Author(s):

L. Yang ◽

A. Castellazzi ◽

A. Fayyaz

Keyword(s):

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Characterization of the optical properties of GaN:Fe for high voltage photoconductive switch applications

2015 IEEE Pulsed Power Conference (PPC) ◽

10.1109/ppc.2015.7296862 ◽

2015 ◽

Author(s):

V. Meyers ◽

D. Mauch ◽

J. Mankowski ◽

J. Dickens ◽

A. Neuber

Keyword(s):

Optical Properties ◽

High Voltage ◽

Photoconductive Switch

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Characterization of a cold atmospheric pressure plasma jet driven by nanosecond high-voltage pulses

2015 IEEE International Conference on Plasma Sciences (ICOPS) ◽

10.1109/plasma.2015.7179949 ◽

2015 ◽

Author(s):

Marco Boselli ◽

Vittorio Colombo ◽

Matteo Gherardi ◽

Romolo Laurita ◽

Anna Liguori ◽

...

Keyword(s):

High Voltage ◽

Atmospheric Pressure ◽

Atmospheric Pressure Plasma ◽

Atmospheric Pressure Plasma Jet ◽

Pressure Plasma ◽

Cold Atmospheric Pressure Plasma ◽

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Characterization of 2D dopant profiles for the design of proton implanted high-voltage superjunction

Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. ◽

10.1109/ipfa.2005.1469180 ◽

2005 ◽

Author(s):

M. Buzzo ◽

M. Ciappa ◽

M. Rub ◽

W. Fichtner

Keyword(s):

High Voltage ◽

Dopant Profiles

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Applications of high-voltage paper electrophoresis for the characterization of drug metabolites

Xenobiotica ◽

10.3109/00498258109045321 ◽

1981 ◽

Vol 11 (12) ◽

pp. 841-847 ◽

Author(s):

J. A. Bell ◽

A. Bradbury ◽

L. E. Martin ◽

R. J. N. Tanner

Keyword(s):

High Voltage ◽

Paper Electrophoresis ◽

Drug Metabolites

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The Characterization of Large Single Crystals by High-Voltage X-Ray Laue Photographs

Advances in X-Ray Analysis ◽

10.1007/978-1-4684-8783-1_13 ◽

1963 ◽

pp. 158-163

Author(s):

H. S. Peiser ◽

E. P. Levine

Keyword(s):

Single Crystals ◽

High Voltage ◽

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Charge trapping effects in cryogenic particle detectors made using single-crystal semiconductor substrates

Journal of Low Temperature Physics ◽

10.1007/bf00693451 ◽

1993 ◽

Vol 93 (3-4) ◽

pp. 399-404 ◽

Author(s):

Brian L. Dougherty ◽

Blas Cabrera ◽

Adrian T. Lee ◽

Michael J. Penn ◽

Betty A. Young

Keyword(s):

Single Crystal ◽

Charge Trapping ◽

Particle Detectors ◽

Semiconductor Substrates ◽

Trapping Effects

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