Characterization of charge-trapping effects in GaN FETs through low-frequency measurements

2014 ◽  
Author(s):  
Gianni Bosi ◽  
Antonio Raffo ◽  
Andrea Nalli ◽  
Valeria Vadala ◽  
Giorgio Vannini
Keyword(s):  
Low Frequency ◽  
Charge Trapping ◽  
Frequency Measurements ◽  
Trapping Effects

Thermal characterization of nonlinear charge trapping effects in GaN-FETs

2014 ◽  
Author(s):  
Gian Piero Gibiino ◽  
Rafael Cignani ◽  
Daniel Niessen ◽  
Dominique Schreurs ◽  
Alberto Santarelli ◽  
...  
Keyword(s):  
Charge Trapping ◽  
Thermal Characterization ◽  
Trapping Effects

Using low-frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction

2004 ◽  
Author(s):  
Jean-Guy Tartarin ◽  
Geoffroy Soubercaze-Pun ◽  
Abdelali Rennane ◽  
Laurent Bary ◽  
Robert Plana ◽  
...  
Keyword(s):  
Technology Assessment ◽  
Low Frequency ◽  
Failure Prediction ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Gan Hemt ◽  
Noise Characterization

Mechanical monolithic tiltmeter for low frequency measurements

2012 ◽  
Author(s):  
F. Acernese ◽  
R. Canonico ◽  
R. De Rosa ◽  
G. Giordano ◽  
R. Romano ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Measurements
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