Investigation on Three Dimensional Image Measurement for Geometrical Parameters of the Cutter

Author(s):  
Yung-Cheng Wang ◽  
Chien-Cheng Chang ◽  
Jui-Chang Lin ◽  
Bee-Yin Lee ◽  
Wei-Shin Lin
2011 ◽  
Vol 131 (2) ◽  
pp. 320-328 ◽  
Author(s):  
Cunwei Lu ◽  
Hiroya Kamitomo ◽  
Ke Sun ◽  
Kazuhiro Tsujino ◽  
Genki Cho

2015 ◽  
Vol 15 (6) ◽  
pp. 29-45
Author(s):  
Ke Sun ◽  
Cunwei Lu

Abstract Since three-dimensional image measurement allows object surface shapes and dimensions to be obtained quickly and without any contact, it has recently been intensively studied in a wide range of fields, including industry, medicine and security. Three-dimensional image measurement technologies can be broadly classified into passive techniques, such as stereovision and active techniques, such as patterned light projection. Among these, the method of projecting optimum intensity modulated light patterns for three-dimensional image measurement can obtain three-dimensional information on the measured object with a single projection, so it is expected to be highly applicable in practice. Measurement can be performed using a single observation image when the object to be measured has simple colouration or surface reflectivity, but for complex objects, eliminating the influence of colour and surface reflectivity requires a reference image to correct the intensity of the observed pattern. To address this, we propose an analysis method and image correction technology, using a novel colour system for realizing three-dimensional measurements using only one observation image.


2004 ◽  
Vol 24 (Supplement1) ◽  
pp. 173-174
Author(s):  
Yuichi MURAI ◽  
Jian Wu QU ◽  
Fujio YAMAMOTO

Author(s):  
R. A. Crowther

The reconstruction of a three-dimensional image of a specimen from a set of electron micrographs reduces, under certain assumptions about the imaging process in the microscope, to the mathematical problem of reconstructing a density distribution from a set of its plane projections.In the absence of noise we can formulate a purely geometrical criterion, which, for a general object, fixes the resolution attainable from a given finite number of views in terms of the size of the object. For simplicity we take the ideal case of projections collected by a series of m equally spaced tilts about a single axis.


Micromachines ◽  
2021 ◽  
Vol 12 (8) ◽  
pp. 929
Author(s):  
Xudong Yang ◽  
Zexiao Li ◽  
Linlin Zhu ◽  
Yuchu Dong ◽  
Lei Liu ◽  
...  

Taper-cutting experiments are important means of exploring the nano-cutting mechanisms of hard and brittle materials. Under current cutting conditions, the brittle-ductile transition depth (BDTD) of a material can be obtained through a taper-cutting experiment. However, taper-cutting experiments mostly rely on ultra-precision machining tools, which have a low efficiency and high cost, and it is thus difficult to realize in situ measurements. For taper-cut surfaces, three-dimensional microscopy and two-dimensional image calculation methods are generally used to obtain the BDTDs of materials, which have a great degree of subjectivity, leading to low accuracy. In this paper, an integrated system-processing platform is designed and established in order to realize the processing, measurement, and evaluation of taper-cutting experiments on hard and brittle materials. A spectral confocal sensor is introduced to assist in the assembly and adjustment of the workpiece. This system can directly perform taper-cutting experiments rather than using ultra-precision machining tools, and a small white light interference sensor is integrated for in situ measurement of the three-dimensional topography of the cutting surface. A method for the calculation of BDTD is proposed in order to accurately obtain the BDTDs of materials based on three-dimensional data that are supplemented by two-dimensional images. The results show that the cutting effects of the integrated platform on taper cutting have a strong agreement with the effects of ultra-precision machining tools, thus proving the stability and reliability of the integrated platform. The two-dimensional image measurement results show that the proposed measurement method is accurate and feasible. Finally, microstructure arrays were fabricated on the integrated platform as a typical case of a high-precision application.


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