Methodology for low power test pattern generation using activity threshold control logic

2007 ◽  
Author(s):  
Srivaths Ravi ◽  
V. R. Devanathan ◽  
Rubin Parekhji
Keyword(s):  
Low Power ◽  
Test Pattern ◽  
Pattern Generation ◽  
Test Pattern Generation ◽  
Control Logic ◽  
Threshold Control ◽  
Power Test ◽  
Low Power Test

A low power test pattern generation for built-in self-test based circuits

2011 ◽  
Vol 98 (3) ◽  
pp. 301-309 ◽  
Author(s):  
Bo Ye ◽  
Tianwang Li ◽  
Qian Zhao ◽  
Duo Zhou ◽  
Xiaohua Wang ◽  
...  
Keyword(s):  
Low Power ◽  
Test Pattern ◽  
Pattern Generation ◽  
Test Pattern Generation ◽  
Power Test ◽  
Low Power Test ◽  
Self Test ◽  
Built In Self Test

A Low Power Test Pattern Generator for BIST

2010 ◽  
Vol E93-C (5) ◽  
pp. 696-702 ◽  
Author(s):  
Shaochong LEI ◽  
Feng LIANG ◽  
Zeye LIU ◽  
Xiaoying WANG ◽  
Zhen WANG
Keyword(s):  
Low Power ◽  
Test Pattern ◽  
Pattern Generator ◽  
Power Test ◽  
Low Power Test

scholarly journals LPTest: a Flexible Low-Power Test Pattern Generator

2009 ◽  
Vol 25 (6) ◽  
pp. 323-335 ◽  
Author(s):  
Meng-Fan Wu ◽  
Kai-Shun Hu ◽  
Jiun-Lang Huang
Keyword(s):  
Low Power ◽  
Test Pattern ◽  
Pattern Generator ◽  
Power Test ◽  
Low Power Test
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