Introduction of Ionic Contributions to a Charge Transport Model for Dielectrics
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2019 ◽
Vol 26
(2)
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pp. 584-592
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2016 ◽
Vol 9
(4)
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pp. 1476-1485
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A Charge Transport Model for SiCOH Dielectric Breakdown in Copper Interconnects and Its Applications
2014 ◽
Vol 14
(1)
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pp. 133-138
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