A New Architecture for Charge Pump Circuit Without Suffering Gate-Oxide Reliability in Low-Voltage CMOS Processes

2007 14th IEEE International Conference on Electronics, Circuits and Systems ◽

10.1109/icecs.2007.4510966 ◽

2007 ◽

Author(s):

Tzu-Ming Wang ◽

Wan-Yi Shen ◽

Ming-Dou Ker

Keyword(s):

Low Voltage ◽

Charge Pump ◽

Oxide Reliability ◽

Charge Pump Circuit ◽

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Design of Charge Pump Circuit With Consideration of Gate-Oxide Reliability in Low-Voltage CMOS Processes

IEEE Journal of Solid-State Circuits ◽

10.1109/jssc.2006.872704 ◽

2006 ◽

Vol 41 (5) ◽

pp. 1100-1107 ◽

Author(s):

M.-D. Ker ◽

S.-L. Chen ◽

C.-S. Tsai

Keyword(s):

Low Voltage ◽

Charge Pump ◽

Oxide Reliability ◽

Charge Pump Circuit ◽

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A new charge pump circuit dealing with gate-oxide reliability issue in low-voltage processes

2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512) ◽

10.1109/iscas.2004.1328196 ◽

2004 ◽

Author(s):

Ming-Dou Ker ◽

Shih-Lun Chen ◽

Chia-Sheng Tsai

Keyword(s):

Low Voltage ◽

Charge Pump ◽

Oxide Reliability ◽

Reliability Issue ◽

Charge Pump Circuit

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Ultra-High-Voltage Charge Pump Circuit in Low-Voltage Bulk CMOS Processes With Polysilicon Diodes

IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing ◽

10.1109/tcsii.2006.882854 ◽

2007 ◽

Vol 54 (1) ◽

pp. 47-51 ◽

Author(s):

Ming-Dou Ker ◽

Shih-Lun Chen

Keyword(s):

High Voltage ◽

Low Voltage ◽

Charge Pump ◽

Charge Pump Circuit ◽

Cmos Processes ◽

Ultra High Voltage

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Gate-Oxide Reliability on CMOS Analog Amplifiers in a 130-nm Low-Voltage CMOS Processes

13th International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.2006.250994 ◽

2006 ◽

Author(s):

Jung-sheng Chen ◽

Ming-dou Ker

Keyword(s):

Low Voltage ◽

Oxide Reliability ◽

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Design of a low voltage charge pump circuit for RFID tag

2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) ◽

10.1109/smelec.2012.6417187 ◽

2012 ◽

Author(s):

Kang Cheng Wei ◽

M. B. I. Reaz ◽

Md. Syedul Amin ◽

Jubayer Jalil ◽

Labonnah F. Rahman

Keyword(s):

Low Voltage ◽

Charge Pump ◽

Rfid Tag ◽

Charge Pump Circuit

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Low voltage SILC and P- and N-MOSFET gate oxide reliability

Microelectronics Reliability ◽

10.1016/j.microrel.2004.08.002 ◽

2005 ◽

Vol 45 (3-4) ◽

pp. 479-485 ◽

Author(s):

C. Petit ◽

A. Meinertzhagen ◽

D. Zander ◽

O. Simonetti ◽

M. Fadlallah ◽

...

Keyword(s):

Low Voltage ◽

Oxide Reliability

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A Quick Boosting Charge Pump Circuit for High Density and Low Voltage Flash Memories

Proceedings of 1994 IEEE Symposium on VLSI Circuits ◽

10.1109/vlsic.1994.586217 ◽

2005 ◽

Author(s):

T. Tanzawa ◽

Y. Tanaka ◽

T. Tanaka ◽

H. Nakamura ◽

H. Oodaira ◽

...

Keyword(s):

Low Voltage ◽

Charge Pump ◽

High Density ◽

Flash Memories ◽

Charge Pump Circuit

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Design of charge pump circuit in low-voltage CMOS process with suppressed return-back leakage current

2010 IEEE International Conference on Integrated Circuit Design and Technology ◽

10.1109/icicdt.2010.5510271 ◽

2010 ◽

Author(s):

Yi-Hsin Weng ◽

Hui-Wen Tsai ◽

Ming-Dou Ker

Keyword(s):

Leakage Current ◽

Low Voltage ◽

Charge Pump ◽

Cmos Process ◽

Charge Pump Circuit

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A new low-voltage charge pump circuit for PLL

2000 IEEE International Symposium on Circuits and Systems. Emerging Technologies for the 21st Century. Proceedings (IEEE Cat No.00CH36353) ◽

10.1109/iscas.2000.857586 ◽

2002 ◽

Author(s):

R.C. Chang ◽

Lung-Chih Kuo

Keyword(s):

Low Voltage ◽

Charge Pump ◽

Charge Pump Circuit

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A Low-Voltage Charge Pump Circuit with High Pumping Efficiency in Standard CMOS Logic Process

2007 IEEE Conference on Electron Devices and Solid-State Circuits ◽

10.1109/edssc.2007.4450126 ◽

2007 ◽

Author(s):

Jin-Young Park ◽

Yeonbae Chung

Keyword(s):

Low Voltage ◽

Charge Pump ◽

Pumping Efficiency ◽

Charge Pump Circuit ◽

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