Design of charge pump circuit in low-voltage CMOS process with suppressed return-back leakage current

Author(s):  
Yi-Hsin Weng ◽  
Hui-Wen Tsai ◽  
Ming-Dou Ker
Author(s):  
Kang Cheng Wei ◽  
M. B. I. Reaz ◽  
Md. Syedul Amin ◽  
Jubayer Jalil ◽  
Labonnah F. Rahman

Author(s):  
Sung Sik Park ◽  
Ju Sang Lee ◽  
Sang Dae Yu

In this paper a new technique is presented to improve the jitter performance of conventional phase frequency detectors by completely removing the unnecessary one-shot pulse. This technique uses a variable pulse-height circuit to control the unnecessary one-shot pulse height. In addition, a novel charge-pump circuit with perfect current-matching characteristics is used to improve the output jitter performance of conventional charge pumps. This circuit is composed of a pair of symmetrical pump circuits to obtain a good current matching. As a result, the proposed charge-pump circuit has perfect current-matching characteristics, wide output range, no glitch output current, and no jump output voltage. In order to verify such operation, circuit simulation is performed using 0.18 μm CMOS process parameters.


2020 ◽  
Vol 140 (1) ◽  
pp. 16-23
Author(s):  
Allex Uemi ◽  
Shota Hino ◽  
Yoshihiro Masui

2005 ◽  
Vol 41 (15) ◽  
pp. 840 ◽  
Author(s):  
T. Hasan ◽  
T. Lehmann ◽  
C.Y. Kwok

Author(s):  
Fan Qiang ◽  
Fu Xiansong ◽  
Niu Pingjuan ◽  
Yang Guanghua ◽  
Gao Tiecheng

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