The influence of the substrate on the thermal stability of InGaAs/InGaAsP quantum wells

Author(s):  
R.W. Glew ◽  
A.T.R. Briggs ◽  
P.D. Greene ◽  
E.M. Allen
1989 ◽  
Vol 160 ◽  
Author(s):  
B. Elman ◽  
Emil S. Koteles ◽  
P. Melman ◽  
C.A. Armiento ◽  
C. Jagannath

AbstractWe present a study of the structural stability of InGaAs/GaAs strained single quantum wells (SQW) grown with a variety of indium compositions and with well widths close to critical thickness values. The samples were grown by molecular beam epitaxy and were subjected to furnace annealing as well as ion implantation followed by rapid thermal annealing. Changes in low temperature photoluminescence linewidths were used to evaluate the stability of strained SQWs. We observed both strain relief, in wide SQWs and strain recovery, in higher indium composition narrow quantum wells which were partially relaxed (low dislocation density) as-grown.


2016 ◽  
Vol 27 (9) ◽  
pp. 9341-9345 ◽  
Author(s):  
Xu Zhang ◽  
Zhi Liu ◽  
Chao He ◽  
Buwen Cheng ◽  
Chunlai Xue ◽  
...  

1993 ◽  
Vol 73 (8) ◽  
pp. 3760-3768 ◽  
Author(s):  
H. Peyre ◽  
F. Alsina ◽  
J. Camassel ◽  
J. Pascual ◽  
R. W. Glew

2001 ◽  
Vol 79 (16) ◽  
pp. 2585-2587 ◽  
Author(s):  
M. Bissiri ◽  
V. Gaspari ◽  
A. Polimeni ◽  
G. Baldassarri Höger von Högersthal ◽  
M. Capizzi ◽  
...  

1995 ◽  
Vol 405 ◽  
Author(s):  
F. Hyuga ◽  
T. Nittono ◽  
K. Watanabe ◽  
T. Furuta

AbstractThermal stabilities of GaAs/InGaP and InGaP/(In)GaAs interfaces are investigated using InGaP/(In)GaAs/InGaP single quantum wells. Annealing is performed at a temperature range between 600 and 900 °C for 10 min. Positions and the full widths at half maximum (FWHM) of photoluminescence (PL) peaks are almost identical to those of as-grown ones up to 800 °C. Blue shifts of PL peaks and increased widths of their FWHM observed after 900 °C annealing are suppressed by shortening the annealing time to 0.1 sec. Annealing at 900 ‘C for 0.1 sec is sufficient to activate Si ions implanted into (In)GaAs layers. As a result, these thermal stabilities are able to provide high reliability and high performance of InGaP/(In)GaAs heterostructure MESFET ICs.


2021 ◽  
pp. 163519
Author(s):  
Artur Lachowski ◽  
Ewa Grzanka ◽  
Szymon Grzanka ◽  
Robert Czernecki ◽  
Mikołaj Grabowski ◽  
...  

2007 ◽  
Vol 91 (20) ◽  
pp. 201921 ◽  
Author(s):  
A. V. Thompson ◽  
C. Boutwell ◽  
J. W. Mares ◽  
W. V. Schoenfeld ◽  
A. Osinsky ◽  
...  

1996 ◽  
Vol 69 (19) ◽  
pp. 2843-2845 ◽  
Author(s):  
M. Godlewski ◽  
J. P. Bergman ◽  
B. Monemar ◽  
E. Kurtz ◽  
D. Hommel

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