Eliminating proximity effects and improving transmission in field emission vacuum microelectronic devices for integrated circuits

2015 IEEE International Electron Devices Meeting (IEDM) ◽

10.1109/iedm.2015.7409819 ◽

2015 ◽

Author(s):

Erich J. Radauscher ◽

Kristin H. Gilchrist ◽

Shane T. Di Dona ◽

Zach E. Russell ◽

Jeffrey R. Piascik ◽

...

Keyword(s):

Integrated Circuits ◽

Field Emission ◽

Proximity Effects ◽

Microelectronic Devices ◽

Vacuum Microelectronic

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Improved Performance of Field Emission Vacuum Microelectronic Devices for Integrated Circuits

IEEE Transactions on Electron Devices ◽

10.1109/ted.2016.2593905 ◽

2016 ◽

Vol 63 (9) ◽

pp. 3753-3760 ◽

Cited By ~ 7

Author(s):

Erich J. Radauscher ◽

Kristin Hedgepath Gilchrist ◽

Shane T. Di Dona ◽

Zachary E. Russell ◽

Jeffrey R. Piascik ◽

...

Keyword(s):

Integrated Circuits ◽

Field Emission ◽

Microelectronic Devices ◽

Vacuum Microelectronic ◽

Improved Performance

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Highly uniform and stable electron field emission from B-doped Si-tip arrays for applications in integrated vacuum microelectronic devices

25th International Vacuum Nanoelectronics Conference ◽

10.1109/ivnc.2012.6316857 ◽

2012 ◽

Cited By ~ 1

Author(s):

R. Schreiner ◽

C. Prommesberger ◽

C. Langer ◽

F. Dams ◽

P. Serbun ◽

...

Keyword(s):

Field Emission ◽

Electron Field Emission ◽

Microelectronic Devices ◽

Electron Field ◽

Vacuum Microelectronic ◽

Highly Uniform

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Stable field emission of single B-doped Si tips and linear current scaling of uniform tip arrays for integrated vacuum microelectronic devices

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

10.1116/1.4765088 ◽

2013 ◽

Vol 31 (2) ◽

pp. 02B101 ◽

Cited By ~ 20

Author(s):

Pavel Serbun ◽

Benjamin Bornmann ◽

Aliaksandr Navitski ◽

Günter Müller ◽

Christian Prommesberger ◽

...

Keyword(s):

Field Emission ◽

Microelectronic Devices ◽

Linear Current ◽

Vacuum Microelectronic ◽

Stable Field

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Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Radiation Environments, Physical Mechanisms, and Foundations for Hardness Assurance

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2013.2254722 ◽

2013 ◽

Vol 60 (3) ◽

pp. 2074-2100 ◽

Cited By ~ 77

Author(s):

J. R. Schwank ◽

M. R. Shaneyfelt ◽

P. E. Dodd

Keyword(s):

Integrated Circuits ◽

Radiation Hardness ◽

Physical Mechanisms ◽

Microelectronic Devices

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11.5: A MEMS-based vacuum gauge for measuring pressure and out-gassing rates in miniaturized vacuum microelectronic devices

International Vacuum Nanoelectronics Conference ◽

10.1109/ivnc.2010.5563229 ◽

2010 ◽

Cited By ~ 4

Author(s):

Julie Chang ◽

Nithya Jayapratha ◽

Rade Kuljic ◽

Benjamin Salvador ◽

Matthew Cantwell ◽

...

Keyword(s):

Vacuum Gauge ◽

Microelectronic Devices ◽

Vacuum Microelectronic

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Processing of vacuum microelectronic devices by focused ion and electron beams

Applied Physics A ◽

10.1007/s00339-002-1941-3 ◽

2003 ◽

Vol 76 (7) ◽

pp. 1007-1012 ◽

Cited By ~ 6

Author(s):

M. Takai ◽

W. Jarupoonphol ◽

C. Ochiai ◽

O. Yavas ◽

Y.K. Park

Keyword(s):

Electron Beams ◽

Microelectronic Devices ◽

Vacuum Microelectronic

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High-Frequency Electrical Model of Through-Silicon Vias for 3-D Integrated Circuits Considering Eddy Current and Proximity Effects

IEEE Transactions on Components Packaging and Manufacturing Technology ◽

10.1109/tcpmt.2017.2741340 ◽

2017 ◽

Vol 7 (12) ◽

pp. 2036-2044 ◽

Cited By ~ 4

Author(s):

Qijun Lu ◽

Zhangming Zhu ◽

Yintang Yang ◽

Ruixue Ding ◽

Yuejin Li

Keyword(s):

Integrated Circuits ◽

Eddy Current ◽

High Frequency ◽

Proximity Effects ◽

Electrical Model ◽

Through Silicon Vias ◽

Silicon Vias

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High field insulation relevant to vacuum microelectronic devices

IEEE Transactions on Dielectrics and Electrical Insulation ◽

10.1109/94.993738 ◽

2002 ◽

Vol 9 (2) ◽

pp. 216-225 ◽

Cited By ~ 4

Author(s):

T.S. Sudarshan ◽

Xianyun Ma ◽

P.G. Muzykov

Keyword(s):

High Field ◽

Microelectronic Devices ◽

Vacuum Microelectronic

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Work Function Of Field Emitter In Vacuum Microelectronic Devices Decreased By Its Geometrical Configuration

[Proceedings] IVMC '93 Sixth International Vacuum Microelectronics Conference ◽

10.1109/ivmc.1993.700275 ◽

2005 ◽

Author(s):

Luo Enze ◽

Liu Yunpeng ◽

Zheng Maosheng ◽

Chen Lujun ◽

Liu Weidong

Keyword(s):

Work Function ◽

Geometrical Configuration ◽

Field Emitter ◽

Microelectronic Devices ◽

Vacuum Microelectronic

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The physics of vacuum microelectronic devices

IEEE Transactions on Electron Devices ◽

10.1109/16.43690 ◽

1989 ◽

Vol 36 (11) ◽

pp. 2599 ◽

Cited By ~ 4

Author(s):

H.F. Gray

Keyword(s):

Microelectronic Devices ◽

Vacuum Microelectronic

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