New insights into the hot carrier degradation (HCD) in FinFET: New observations, unified compact model, and impacts on circuit reliability

2017 ◽  
Author(s):  
Zhuoqing Yu ◽  
Jiayang Zhang ◽  
Runsheng Wang ◽  
Shaofeng Guo ◽  
Changze Liu ◽  
...  
Keyword(s):  
Compact Model ◽  
Circuit Reliability ◽  
Hot Carrier ◽  
Hot Carrier Degradation

scholarly journals A unified aging compact model for hot carrier degradation under mixed-mode and reverse E-B stress in complementary SiGe HBTs

2020 ◽  
Vol 172 ◽  
pp. 107900
Author(s):  
C. Mukherjee ◽  
G.G. Fischer ◽  
F. Marc ◽  
M. Couret ◽  
T. Zimmer ◽  
...  
Keyword(s):  
Mixed Mode ◽  
Compact Model ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Hot-Carrier Degradation in SiGe HBTs: A Physical and Versatile Aging Compact Model

2017 ◽  
Vol 64 (12) ◽  
pp. 4861-4867 ◽  
Author(s):  
Chhandak Mukherjee ◽  
Thomas Jacquet ◽  
Gerhard G. Fischer ◽  
Thomas Zimmer ◽  
Cristell Maneux
Keyword(s):  
Compact Model ◽  
Hot Carrier ◽  
Hot Carrier Degradation

scholarly journals A physical and versatile aging compact model for hot carrier degradation in SiGe HBTs under dynamic operating conditions

2020 ◽  
Vol 163 ◽  
pp. 107635 ◽  
Author(s):  
C. Mukherjee ◽  
F. Marc ◽  
M. Couret ◽  
G.G. Fischer ◽  
M. Jaoul ◽  
...  
Keyword(s):  
Operating Conditions ◽  
Compact Model ◽  
Hot Carrier ◽  
Dynamic Operating ◽  
Hot Carrier Degradation

Self-Heating Effects on Hot Carrier Degradation and Its Impact on Logic Circuit Reliability

2019 ◽  
Vol 19 (2) ◽  
pp. 249-254 ◽  
Author(s):  
Peter Paliwoda ◽  
Zakariae Chbili ◽  
Andreas Kerber ◽  
Tanya Nigam ◽  
K. Nagahiro ◽  
...  
Keyword(s):  
Logic Circuit ◽  
Circuit Reliability ◽  
Hot Carrier ◽  
Self Heating ◽  
Heating Effects ◽  
Hot Carrier Degradation

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation

THE IMPACT OF DIFFERENT HOT-CARRIER-DEGRADATION COMPONENTS ON THE OPTIMIZATION OF SUBMICRON n-CHANNEL LDD TRANSISTORS

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-787-C4-790
Author(s):  
P. T.J. BIERMANS ◽  
T. POORTER ◽  
H. J.H. MERKS-EPPINGBROEK
Keyword(s):  
Hot Carrier ◽  
The Impact ◽  
Hot Carrier Degradation

Localizing Hot-Carrier Degradation in Silicon Trench MOSFETs

2021 ◽  
Vol 68 (4) ◽  
pp. 1804-1809
Author(s):  
Bernhard Ruch ◽  
Gregor Pobegen ◽  
Tibor Grasser
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Degradation
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